SLVSII6 January   2026 TVS5800

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings - JEDEC
    3. 6.3 ESD Ratings - IEC
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Thermal Information
    6. 6.6 Electrical Characteristics
    7. 6.7 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
    4. 7.4 Device Functional Modes
      1. 7.4.1 Protection Specifications
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
  10. Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Support Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information

Protection Specifications

The TVS5800 is specified according to the IEC 61000-4-5 standard. The IEC 61000-4-5 standards requires protection against a pulse with a rise time of 8µs and a half length of 20µs.

The TVS5800 has been tested according to IEC 61000-4-5 to pass a ±1kV surge test through a 42Ω coupling resistor and a 0.5µF capacitor. This test is a common test requirement for industrial signal I/O lines and the TVS5800 serves as an desired protection design for applications with that requirement.

The TVS5800 also integrates IEC 61000-4-2 level 4 ESD Protection. These combine to maintain that the device can protect against most transient conditions regardless of length or type.

For more information on TI's test methods for Surge, ESD, and EFT testing, reference TI's IEC 61000-4-x Testing Application Note