SPRSP65H April 2021 – December 2025 AM2431 , AM2432 , AM2434
PRODUCTION DATA
The estimated POH data for continuous device operation at specific junction temperatures is provided in the table below.
| Temperature Rating |
Temperature Range | JUNCTION TEMP (TJ)(1) |
ESTIMATED(2) LIFETIME (POH)(3) |
|---|---|---|---|
| A | -40°C to 105°C | 105°C | 100000 |
| I | -40°C to 125°C | 105°C | 100000 |
| 110°C | 64000 | ||
| 115°C | 41000 | ||
| 120°C | 26500 | ||
| 125°C | 17500 |
Calculating Useful Lifetimes of Embedded Processors
This application report provides a methodology for calculating the useful lifetime of TI embedded processors (EP) under power when used in electronic systems. The document is intended for general engineers who wish to determine if the reliability of the TI EP device meets the end system reliability requirement. Electro-migration is the primary failure mechanism being modeled.