SPRZ580A December   2024  – October 2025 AM62D-Q1

 

  1.   1
  2.   Abstract
  3. 1Usage Notes and Advisories Matrices
    1. 1.1 Devices Supported
  4. 2Silicon Usage Notes and Advisories
    1. 2.1 Silicon Usage Notes
      1.      i2351
      2.      i2330
      3.      i2372
    2. 2.2 Silicon Advisories
      1.      i2049
      2.      i2062
      3.      i2087
      4.      i2134
      5.      i2189
      6.      i2196
      7.      i2199
      8.      i2208
      9.      i2249
      10.      i2278
      11.      i2279
      12.      i2310
      13.      i2311
      14.      i2312
      15.      i2366
      16.      i2371
      17.      i2120
      18.      i2137
      19.      i2253
      20.      i2383
      21.      i2401
      22.      i2407
      23.      i2409
      24.      i2410
      25.      i2376
      26.      i2399
      27.      i2413
      28.      i2414
      29.      i2417
      30.      i2419
      31.      i2420
      32.      i2421
      33.      i2422
      34.      i2423
      35.      i2431
      36.      i2435
      37.      i2160
      38.      i2436
      39.      i2482
      40.      i2464
      41.      i2487
      42.      i2493
  5.   Trademarks
  6.   Revision History

i2493

MMCSD: HS200 write failures

Details:

The MMC0 interface has the potential for write failures when issuing multiple block writes operating in HS200 mode with excessive IO supply noise.

To minimize IO supply noise follow below best practices and refer to the linked application note:

  • Use wide power planes/pours adjacent to ground layers with a thin dielectric between them.
  • Place power planes/pours and adjacent ground planes as close to the surface of the powered components as possible.
  • Use a wide variety of decoupling capacitor values and place low ESL capacitors as close to the decoupled device as possible.
  • Use one decoupling capacitor per power pin.
  • Use short and wide traces to decoupling capacitors and power/ground vias.
  • Sitara™ Processor Power Distribution Networks: Implementation and Analysis

Workaround(s):

Implement a software recovery mechanism that re-issues the failed multiple block write with minimum 5μs delay between blocks to reduce noise. One way to achieve this delay is using single block writes for the failed multiple block write.