TIDUFC1A November 2025 – February 2026
The following ADC settings are used for the noise and linearity tests:
| SETTING | SELECTION | GUI LOCATION |
|---|---|---|
| REF_RNG | High-reference range | Register Map Config - CONFIG1 |
| CLK_SEL | Internal clock operation | Register Map Config - CONFIG3 |
| VREF | 4.096V | Interface Configuration |
| Speed Mode | High speed | Interface Configuration |
| Filter Type | Sinc4+Sinc1 | Interface Configuration |
| OSR | 26667 | Interface Configuration |
| CLK Divider | Divide by 8 | Interface Configuration |
| CLK Source | External | Clock Settings |
| CLK Frequency | 25.6MHz | Clock Settings |
| SCLK Source | Internal (PHI) | Clock Settings |
| SCLK Frequency | 25.6MHz | Clock Settings |
| Samples | 1024 | Interface Configuration |
Locate the clock settings by pressing the gear icon next to the SCLK and MCLK frequencies, as shown in Figure 4-7. Any settings not shown in Table 4-4 are left at the GUI default settings. The calculated data rate is set to 60SPS with these changes. Use an external clock source to test other data rates, such as 10PLC (power line cycles) or 0.1PLC. Use connector J22 and move JP5 to the 1–2 position to connect an external clock source. See Section 4.1.5 for more details.