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UCC27444-Q1

ACTIVE

Automotive 20V VDD, 4A/4A dual-channel low-side driver with -5V input capability and enable

Product details

Number of channels 2 Power switch IGBT, MOSFET Peak output current (A) 4 Input supply voltage (min) (V) 4 Input supply voltage (max) (V) 18 Features Enable pin Operating temperature range (°C) -40 to 125 Fall time (ns) 7 Input threshold CMOS, TTL Channel input logic Non-Inverting Input negative voltage (V) -5 Rating Automotive Driver configuration Non-Inverting
Number of channels 2 Power switch IGBT, MOSFET Peak output current (A) 4 Input supply voltage (min) (V) 4 Input supply voltage (max) (V) 18 Features Enable pin Operating temperature range (°C) -40 to 125 Fall time (ns) 7 Input threshold CMOS, TTL Channel input logic Non-Inverting Input negative voltage (V) -5 Rating Automotive Driver configuration Non-Inverting
HVSSOP (DGN) 8 14.7 mm² (3 mm × 4.9 mm) SOIC (D) 8 29.4 mm² (4.9 mm × 6 mm)
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 1: –40°C to +125°C ambient operating temperature range
    • Device HBM ESD classification level H2
    • Device CDM ESD classification level C6
  • Typical 4-A peak source and sink drive current for each channel
  • INA and INB input pins capable of handling –5 V
  • Absolute maximum VDD voltage 20 V
  • Wide VDD operating range from 4.5 V to 18 V
  • Two independent gate drive channels
  • Independent enable function for each output
  • Fast propagation delays (18-ns typical)
  • Fast rise and fall times (11-ns and 7-ns typical)
  • 1-ns typical delay matching between the two channels
  • SOIC8 and VSSOP8 PowerPAD™ package options
  • Operating junction temperature range of –40°C to 125°C
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 1: –40°C to +125°C ambient operating temperature range
    • Device HBM ESD classification level H2
    • Device CDM ESD classification level C6
  • Typical 4-A peak source and sink drive current for each channel
  • INA and INB input pins capable of handling –5 V
  • Absolute maximum VDD voltage 20 V
  • Wide VDD operating range from 4.5 V to 18 V
  • Two independent gate drive channels
  • Independent enable function for each output
  • Fast propagation delays (18-ns typical)
  • Fast rise and fall times (11-ns and 7-ns typical)
  • 1-ns typical delay matching between the two channels
  • SOIC8 and VSSOP8 PowerPAD™ package options
  • Operating junction temperature range of –40°C to 125°C

The UCC27444-Q1 is a dual-channel, high-speed, low-side gate driver that effectively drives MOSFET and GaN power switches. UCC27444-Q1 has a typical peak drive strength of 4 A, which reduces rise and fall times of the power switches, lowers switching losses, and increases efficiency. The device’s fast propagation delay (18-ns typical) yields better power stage efficiency by improving the deadtime optimization, pulse width utilization, control loop response, and transient performance of the system.

The UCC27444-Q1 can handle –5 V at its INx inputs, which improves robustness in systems with moderate ground bouncing. The inputs can be connected to most controller outputs for maximum control flexibility. An independent enable signal allows the power stage to be controlled independently of main control logic. In the event of a system fault, the gate driver can quickly shut-off by pulling enable low. Many high-frequency switching power supplies exhibit noise at the gate of the power device, which can get injected into the output pin on the gate driver and can cause the driver to malfunction. The device’s transient reverse current and reverse voltage capability allow it to tolerate noise on the gate of the power device or pulse-transformer and avoid driver malfunction.

The UCC27444-Q1 also features low voltage operation and power on reset (POR) for improved system robustness. When there is not enough bias voltage to fully enhance the power device, the gate driver output is held low by the strong internal pull down MOSFET.

The UCC27444-Q1 is a dual-channel, high-speed, low-side gate driver that effectively drives MOSFET and GaN power switches. UCC27444-Q1 has a typical peak drive strength of 4 A, which reduces rise and fall times of the power switches, lowers switching losses, and increases efficiency. The device’s fast propagation delay (18-ns typical) yields better power stage efficiency by improving the deadtime optimization, pulse width utilization, control loop response, and transient performance of the system.

The UCC27444-Q1 can handle –5 V at its INx inputs, which improves robustness in systems with moderate ground bouncing. The inputs can be connected to most controller outputs for maximum control flexibility. An independent enable signal allows the power stage to be controlled independently of main control logic. In the event of a system fault, the gate driver can quickly shut-off by pulling enable low. Many high-frequency switching power supplies exhibit noise at the gate of the power device, which can get injected into the output pin on the gate driver and can cause the driver to malfunction. The device’s transient reverse current and reverse voltage capability allow it to tolerate noise on the gate of the power device or pulse-transformer and avoid driver malfunction.

The UCC27444-Q1 also features low voltage operation and power on reset (POR) for improved system robustness. When there is not enough bias voltage to fully enhance the power device, the gate driver output is held low by the strong internal pull down MOSFET.

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Technical documentation

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Top documentation Type Title Format options Date
* Data sheet UCC27444-Q1 20-V, 4-A Dual-Channel Low-Side Gate Driver with –5-V Input Capability For Automotive Applications datasheet (Rev. A) PDF | HTML Jul 20, 2023
Application note Riding the Wave of Non-Isolated Gate Drivers in LEVs PDF | HTML Nov 14, 2025
Application brief Why Low-Side Gate Drivers are Better Than Discrete Designs PDF | HTML Nov 13, 2025
White paper Driving the Next xEVs With High-Performing Non-Isolated Gate Drivers PDF | HTML Apr 2, 2025
Application note Why use a Gate Drive Transformer? PDF | HTML Mar 4, 2024
Application note Static Magnet Power Supply Design for Magnetic Resonance Imaging Application PDF | HTML Jan 22, 2024
Application note Review of Different Power Factor Correction (PFC) Topologies' Gate Driver Needs PDF | HTML Jan 22, 2024
Application note Benefits of a Compact, Powerful, and Robust Low-Side Gate Driver PDF | HTML Nov 10, 2021
Application brief External Gate Resistor Selection Guide (Rev. A) Feb 28, 2020
Application brief Understanding Peak IOH and IOL Currents (Rev. A) Feb 28, 2020
Application note Improving Efficiency of DC-DC Conversion through Layout May 7, 2019
Application brief How to overcome negative voltage transients on low-side gate drivers' inputs Jan 18, 2019
Application brief High-Side Cutoff Switches for High-Power Automotive Applications (Rev. A) Nov 26, 2018
Application note PFC Design Choice for On Board Charger Designs May 24, 2018
Application brief Reducing Switching Losses in On-Board Chargers for Electric Vehicles Mar 27, 2018

Design & development

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Evaluation board

UCC27423-4-5-Q1EVM — UCC2742xQ1 Dual 4-A High-Speed Low-Side MOSFET Drivers With Enable Evaluation Module (EVM)

The UCC2742xQ1 EVM is a high-speed dual MOSFET evaluation module that provides a test platform for a quick and easy startup of the UCC2742xQ1 driver. Powered by a single 4V to 15V external supply, and featuring a comprehensive set of test points and jumpers. All of the devices have separate input (...)
User guide: PDF
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SOIC (D) 8 Ultra Librarian

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