CD4508B

ACTIVO

Cierre doble CMOS de 4 bits

Detalles del producto

Number of channels 8 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type 3-State Clock frequency (max) (MHz) 8 IOL (max) (mA) 2.4 IOH (max) (mA) -2.4 Supply current (max) (µA) 3000 Features High speed (tpd 10-50ns), Partial power down (Ioff), Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
Number of channels 8 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type 3-State Clock frequency (max) (MHz) 8 IOL (max) (mA) 2.4 IOH (max) (mA) -2.4 Supply current (max) (µA) 3000 Features High speed (tpd 10-50ns), Partial power down (Ioff), Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
SOIC (DW) 24 159.65 mm² 15.5 x 10.3 SOP (NS) 24 117 mm² 15 x 7.8 TSSOP (PW) 24 49.92 mm² 7.8 x 6.4
  • Two independent 4-bit latches
  • Individual master reset for each 4-bit latch
  • 3-state outputs with high-impedance state for bus line applications
  • Medium-speed operation: tPHL = tPLH = 70 ns (typ.) at VDD = 10 V and CL = 50 pF
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Standardized, symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Buffer storage
    • Holding registers
    • Data storage and multiplexing

  • Two independent 4-bit latches
  • Individual master reset for each 4-bit latch
  • 3-state outputs with high-impedance state for bus line applications
  • Medium-speed operation: tPHL = tPLH = 70 ns (typ.) at VDD = 10 V and CL = 50 pF
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Standardized, symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Buffer storage
    • Holding registers
    • Data storage and multiplexing

CD4508B dual 4-bit latch contains two identical 4-bit latches with separate STROBE, RESET, and OUTPUT DISABLE control. With the STROBE line in the high state, the data on the "D" inputs appear at the corresponding "Q" outputs provided the DISABLE line is in the low state. Changing the STROBE line to the low state locks the data into the latch. A high on the reset line forces the outputs to a low level regardless of the state of the STROBE input. The outputs are forced to the high-impedance state for bus line applications by a high level on the DISABLE input.

The CD4508B types are supplied in 24-lead hermetic dual-in-line ceramic packages (F3A suffix), 24-lead dual-in-line plastic packages (E suffix), 24-lead small-outline packages (M, M96, and NSR suffixes), and 24-lead thin shrink small-outline packages (PW and PWR suffixes).

The CD4508B is similar to industry type MC14508.

CD4508B dual 4-bit latch contains two identical 4-bit latches with separate STROBE, RESET, and OUTPUT DISABLE control. With the STROBE line in the high state, the data on the "D" inputs appear at the corresponding "Q" outputs provided the DISABLE line is in the low state. Changing the STROBE line to the low state locks the data into the latch. A high on the reset line forces the outputs to a low level regardless of the state of the STROBE input. The outputs are forced to the high-impedance state for bus line applications by a high level on the DISABLE input.

The CD4508B types are supplied in 24-lead hermetic dual-in-line ceramic packages (F3A suffix), 24-lead dual-in-line plastic packages (E suffix), 24-lead small-outline packages (M, M96, and NSR suffixes), and 24-lead thin shrink small-outline packages (PW and PWR suffixes).

The CD4508B is similar to industry type MC14508.

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Documentación técnica

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Tipo Título Fecha
* Data sheet CD4508B TYPES datasheet (Rev. B) 16 jun 2003
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 15 dic 2022
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
User guide Signal Switch Data Book (Rev. A) 14 nov 2003
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 03 dic 2001

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

14-24-LOGIC-EVM — Módulo de evaluación genérico de productos lógicos para encapsulados D, DB, DGV, DW, DYY, NS y PW de

El módulo de evaluación 14-24-LOGIC-EVM (EVM) está diseñado para admitir cualquier dispositivo lógico que esté en un encapsulado D, DW, DB, NS, PW, DYY o DGV de 14 a 24 pines.

Guía del usuario: PDF | HTML
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SOIC (DW) 24 Ultra Librarian
SOP (NS) 24 Ultra Librarian
TSSOP (PW) 24 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

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