Detalles del producto

Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 36 Vs (min) (V) 2 Rating Space Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2 Rail-to-rail In to V- Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 25 VICR (max) (V) 34.5 VICR (min) (V) 0
Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 36 Vs (min) (V) 2 Rating Space Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2 Rail-to-rail In to V- Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 25 VICR (max) (V) 34.5 VICR (min) (V) 0
CDIP (J) 14 130.4652 mm² 19.56 x 6.67 DIESALE (KGD) See data sheet
  • QML-V Qualified, SMD 5962-7700801VCA, 5962-9673802VCA
    and 5962-9673802V9B
  • Rad-Tolerant: 40 kRad/sec (Si) TID
    (5962-9673802VCA and 5962-9673802V9B)(1)
    • TID Dose Rate = 0.01 rad/sec (Si)
  • Wide Supply Ranges
    • Single Supply: 2 V to 36 V
      (Tested to 30 V)
    • Dual Supplies: ±1 V to ±18 V
      (Tested to ±15 V)
  • Low Supply-Current Drain Independent of Supply Voltage:
    0.8 mA (Typ)
  • Low Input Bias Current: 25 nA (Typ)
  • Low Input Offset Current: 3 nA (Typ) (LM139)
  • Low Input Offset Voltage: 2 mV (Typ)
  • Common-Mode Input Voltage Range Includes Ground
  • Differential Input Voltage Range Equal to Maximum-Rated
    Supply Voltage: ±36 V
  • Low Output Saturation Voltage
  • Output Compatible With TTL, MOS, and CMOS

(1) Radiation tolerance is a typical value based upon initial device qualification with dose rate = 0.01 rad/sec. Radiation lot acceptance testing is available - contact factory for details.

  • QML-V Qualified, SMD 5962-7700801VCA, 5962-9673802VCA
    and 5962-9673802V9B
  • Rad-Tolerant: 40 kRad/sec (Si) TID
    (5962-9673802VCA and 5962-9673802V9B)(1)
    • TID Dose Rate = 0.01 rad/sec (Si)
  • Wide Supply Ranges
    • Single Supply: 2 V to 36 V
      (Tested to 30 V)
    • Dual Supplies: ±1 V to ±18 V
      (Tested to ±15 V)
  • Low Supply-Current Drain Independent of Supply Voltage:
    0.8 mA (Typ)
  • Low Input Bias Current: 25 nA (Typ)
  • Low Input Offset Current: 3 nA (Typ) (LM139)
  • Low Input Offset Voltage: 2 mV (Typ)
  • Common-Mode Input Voltage Range Includes Ground
  • Differential Input Voltage Range Equal to Maximum-Rated
    Supply Voltage: ±36 V
  • Low Output Saturation Voltage
  • Output Compatible With TTL, MOS, and CMOS

(1) Radiation tolerance is a typical value based upon initial device qualification with dose rate = 0.01 rad/sec. Radiation lot acceptance testing is available - contact factory for details.

These devices consist of four independent voltage comparators that are designed to operate from a single power supply over a wide range of voltages. Operation from dual supplies also is possible, as long as the difference between the two supplies is 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. Current drain is independent of the supply voltage. The outputs can be connected to other open-collector outputs to achieve wired-AND relationships.

The LM139 and LM139A are characterized for operation over the full military temperature range of –55°C to 125°C.

These devices consist of four independent voltage comparators that are designed to operate from a single power supply over a wide range of voltages. Operation from dual supplies also is possible, as long as the difference between the two supplies is 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. Current drain is independent of the supply voltage. The outputs can be connected to other open-collector outputs to achieve wired-AND relationships.

The LM139 and LM139A are characterized for operation over the full military temperature range of –55°C to 125°C.

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Documentación técnica

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Tipo Título Fecha
* Data sheet Quad Differential Comparator. datasheet (Rev. C) 02 mar 2011
* SMD LM139-SP SMD 5962-77008 08 jul 2016
* Radiation & reliability report LM139-SP ELDRS Report 31 mar 2015
Application brief DLA Approved Optimizations for QML Products (Rev. A) PDF | HTML 05 jun 2024
Selection guide TI Space Products (Rev. J) 12 feb 2024
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 31 ago 2023
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 17 nov 2022
Application note Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 19 oct 2022
Application brief Analog Front-End Design With Texas Instruments’ Tooling Landscape PDF | HTML 07 mar 2022
E-book The Signal e-book: A compendium of blog posts on op amp design topics 28 mar 2017

Diseño y desarrollo

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Modelo de simulación

LM139 PSpice Model

SLCJ002.ZIP (0 KB) - PSpice Model
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
Guía del usuario: PDF
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
CDIP (J) 14 Ultra Librarian
DIESALE (KGD)

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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