SN54F109

ACTIVO

Biestables de tipo D con activación de borde positivo J-K doble con opciones de eliminación y preaju

Detalles del producto

Number of channels 2 Technology family F Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 IOL (max) (mA) -1 IOH (max) (mA) 20 Operating temperature range (°C) -55 to 125 Rating Military
Number of channels 2 Technology family F Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 IOL (max) (mA) -1 IOH (max) (mA) 20 Operating temperature range (°C) -55 to 125 Rating Military
CDIP (J) 16 135.3552 mm² 19.56 x 6.92 CFP (W) 16 69.319 mm² 10.3 x 6.73 LCCC (FK) 20 79.0321 mm² 8.89 x 8.89
  • Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs
  • Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs

These devices contain two independent J-K\ positive-edge-triggered flip-flops. A low level at the preset (PRE\) or clear (CLR\) inputs sets or resets the outputs regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the J and K\ input meeting the setup-time requirements are transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold time interval, data at the J and K\ inputs may be changed without affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by grounding K\ and trying J high. They also can perform as D-type flip-flops if J and K\ are tied together.

The SN54F109 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74F109 is characterized for operation from 0°C to 70°C.

These devices contain two independent J-K\ positive-edge-triggered flip-flops. A low level at the preset (PRE\) or clear (CLR\) inputs sets or resets the outputs regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the J and K\ input meeting the setup-time requirements are transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold time interval, data at the J and K\ inputs may be changed without affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by grounding K\ and trying J high. They also can perform as D-type flip-flops if J and K\ are tied together.

The SN54F109 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74F109 is characterized for operation from 0°C to 70°C.

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Documentación técnica

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Tipo Título Fecha
* Data sheet Dual J-K Positive-Edge-Triggered Flip-Flops w/Clear And Preset datasheet (Rev. A) 01 oct 1993
* SMD SN54F109 SMD 5962-97580 21 jun 2016
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 15 dic 2022
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 ago 2002
Application note Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 01 ago 1997
Application note Designing With Logic (Rev. C) 01 jun 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 oct 1996

Diseño y desarrollo

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Paquete Pasadores Descargar
CDIP (J) 16 Ver opciones
CFP (W) 16 Ver opciones
LCCC (FK) 20 Ver opciones

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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