SN74AC563

ACTIVO

Bloqueos octales transparentes de tipo D con salidas de 3 estados

Detalles del producto

Number of channels 8 Technology family AC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type 3-State Clock frequency (max) (MHz) 100 IOL (max) (mA) 24 IOH (max) (mA) -24 Supply current (max) (µA) 80 Features Balanced outputs, Flow-through pinout, High speed (tpd 10-50ns), Inverting output, Positive input clamp diode Operating temperature range (°C) -40 to 85 Rating Catalog
Number of channels 8 Technology family AC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type 3-State Clock frequency (max) (MHz) 100 IOL (max) (mA) 24 IOH (max) (mA) -24 Supply current (max) (µA) 80 Features Balanced outputs, Flow-through pinout, High speed (tpd 10-50ns), Inverting output, Positive input clamp diode Operating temperature range (°C) -40 to 85 Rating Catalog
PDIP (N) 20 228.702 mm² 24.33 x 9.4 SOIC (DW) 20 131.84 mm² 12.8 x 10.3 SSOP (DB) 20 56.16 mm² 7.2 x 7.8 TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • 2-V to 6-V VCC Operation
  • Inputs Accept Voltages to 6 V
  • Max tpd of 9 ns at 5 V
  • 3-State Inverting Outputs Drive Bus Lines Directly
  • Full Parallel Access for Loading
  • Flow-Through Architecture to Optimize PCB Layout

  • 2-V to 6-V VCC Operation
  • Inputs Accept Voltages to 6 V
  • Max tpd of 9 ns at 5 V
  • 3-State Inverting Outputs Drive Bus Lines Directly
  • Full Parallel Access for Loading
  • Flow-Through Architecture to Optimize PCB Layout

The ’AC563 devices are octal D-type transparent latches with 3-state outputs. When the latch-enable (LE) input is high, the Q\ outputs follow the complements of the data (D) inputs. When LE is taken low, the Q\ outputs are latched at the inverse logic levels set up at the D inputs.

A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

(OE)\ does not affect internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The ’AC563 devices are octal D-type transparent latches with 3-state outputs. When the latch-enable (LE) input is high, the Q\ outputs follow the complements of the data (D) inputs. When LE is taken low, the Q\ outputs are latched at the inverse logic levels set up at the D inputs.

A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

(OE)\ does not affect internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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Documentación técnica

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Tipo Título Fecha
* Data sheet SN54AC563, SN74AC563 datasheet (Rev. C) 23 oct 2003

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

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