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SN74LVC1G80-Q1

ACTIVO

Biestable único de tipo D con activación de borde positivo de calidad automotriz

Detalles del producto

Number of channels 1 Technology family LVC Input type Standard CMOS Output type Push-Pull Clock frequency (max) (MHz) 150 IOL (max) (mA) 32 IOH (max) (mA) -32 Supply current (max) (µA) 10 Features Balanced outputs, Over-voltage tolerant inputs Operating temperature range (°C) -40 to 125 Rating Automotive
Number of channels 1 Technology family LVC Input type Standard CMOS Output type Push-Pull Clock frequency (max) (MHz) 150 IOL (max) (mA) 32 IOH (max) (mA) -32 Supply current (max) (µA) 10 Features Balanced outputs, Over-voltage tolerant inputs Operating temperature range (°C) -40 to 125 Rating Automotive
SOT-SC70 (DCK) 5 4.2 mm² (2 mm × 2.1 mm)
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • ±4000V Human-Body Model (HBM) ESD classification level 3A
    • ±1000V Charged-Device Model (CDM) ESD classification level C5
  • Supports 5V VCC operation
  • Inputs accept voltages to 5.5V
  • Supports down translation to VCC
  • Maximum tpd of 6ns at 3.3V
  • Low power consumption, 10µA maximum ICC
  • ±24mA output drive at 3.3V
  • Ioff supports partial-power-down mode and back-drive protection
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • ±4000V Human-Body Model (HBM) ESD classification level 3A
    • ±1000V Charged-Device Model (CDM) ESD classification level C5
  • Supports 5V VCC operation
  • Inputs accept voltages to 5.5V
  • Supports down translation to VCC
  • Maximum tpd of 6ns at 3.3V
  • Low power consumption, 10µA maximum ICC
  • ±24mA output drive at 3.3V
  • Ioff supports partial-power-down mode and back-drive protection

The SN74LVC1G80-Q1 device is an automotive AEC-Q100 qualified, single positive-edge-triggered D-type flip-flop that is designed for 1.65V to 5.5V VCC operation.

When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the level at the output.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs when the device is powered down. This inhibits current backflow into the device which prevents damage to the device.

The SN74LVC1G80-Q1 device is an automotive AEC-Q100 qualified, single positive-edge-triggered D-type flip-flop that is designed for 1.65V to 5.5V VCC operation.

When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the level at the output.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs when the device is powered down. This inhibits current backflow into the device which prevents damage to the device.

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Documentación principal Tipo Título Opciones de formato Descargar la versión más reciente en inglés Fecha
* Hoja de datos SN74LVC1G80 -Q1 Single Positive-Edge-Triggered D-Type Flip-Flop datasheet (Rev. A) PDF | HTML 14/08/2026

Diseño y desarrollo

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Placa de evaluación

5-8-LOGIC-EVM — Módulo de evaluación de lógico genérico para encapsulados DCK, DCT, DCU, DRL y DBV,de 5- a 8-pines

EVM flexible diseñado para admitir cualquier dispositivo que tenga un encapsulado DCK, DCT, DCU, DRL o DBV y entre 5 y 8 pines.
Guía del usuario: PDF
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