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類比轉數位轉換器 (ADC)
高速 ADC (≥10 MSPS)
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ADC12DJ5200-SEP

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Radiation-tolerant, 30-krad, 12-bit, dual 5.2-GSPS or single 10.4-GSPS ADC

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產品規格表

ADC12DJ5200-SEP

現行
產品規格表 立即訂購

產品詳細資料

Sample rate (max) (Msps) 5200, 10400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type JESD204B, JESD204C Analog input BW (MHz) 7900 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.825 Power consumption (typ) (mW) 4000 Architecture Folding Interpolating SNR (dB) 55.6 ENOB (bit) 8.8 SFDR (dB) 65 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 30 Radiation, SEL (MeV·cm2/mg) 43
Sample rate (max) (Msps) 5200, 10400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type JESD204B, JESD204C Analog input BW (MHz) 7900 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.825 Power consumption (typ) (mW) 4000 Architecture Folding Interpolating SNR (dB) 55.6 ENOB (bit) 8.8 SFDR (dB) 65 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 30 Radiation, SEL (MeV·cm2/mg) 43
FCCSP (ALR) 144 100 mm² 10 x 10
  • Radiation Tolerance:
    • Total Ionizing Dose (TID): 30 krad (Si)
    • Single Event Latchup (SEL): 43 MeV-cm 2/mg
    • Single Event Upset (SEU) immune registers
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 out-gassing specification
    • Vendor item drawing (VID) V62/22611
    • Temperature range: –55°C to 125°C
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Extended product change notification
  • ADC core:
    • 12-bit resolution
    • Up to 10.4 GSPS in single-channel mode
    • Up to 5.2 GSPS in dual-channel mode
  • Performance specifications:
    • Noise floor (–20 dBFS, V FS = 1 V PP-DIFF):
      • Dual-channel mode: –151.8 dBFS/Hz
      • Single-channel mode: –154.4 dBFS/Hz
    • ENOB (dual channel, F IN = 2.4 GHz): 8.6 Bits
  • Buffered analog inputs with V CMI of 0 V:
    • Analog input bandwidth (–3 dB): 8 GHz
    • Usable input frequency range: > 10 GHz
    • Full-scale input voltage (V FS, default): 0.8 V PP
  • Noiseless aperture delay (t AD) adjustment:
    • Precise sampling control: 19-fs Step
    • Simplifies synchronization and interleaving
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features:
    • Automatic SYSREF timing calibration
    • Time stamp for sample marking
  • JESD204C serial data interface:
    • Maximum lane rate: 17.16 Gbps
    • Support for 64b/66b and 8b/10b encoding
    • 8b/10b modes are JESD204B compatible
  • Optional digital down-converters (DDC):
    • Complex decimation: 4x (IBW = 0.2*F S = 2.08 GHz in DES mode, 1.04 GHz per channel in dual channel mode), 8x, 16x and 32x
    • Four independent 32-Bit NCOs per DDC
  • Peak RF Input Power (Diff): +26.5 dBm (+ 27.5 dBFS, 560x fullscale power)
  • Programmable FIR filter for equalization
  • Power consumption: 4 W
  • Power supplies: 1.1 V, 1.9 V
  • Radiation Tolerance:
    • Total Ionizing Dose (TID): 30 krad (Si)
    • Single Event Latchup (SEL): 43 MeV-cm 2/mg
    • Single Event Upset (SEU) immune registers
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 out-gassing specification
    • Vendor item drawing (VID) V62/22611
    • Temperature range: –55°C to 125°C
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Extended product change notification
  • ADC core:
    • 12-bit resolution
    • Up to 10.4 GSPS in single-channel mode
    • Up to 5.2 GSPS in dual-channel mode
  • Performance specifications:
    • Noise floor (–20 dBFS, V FS = 1 V PP-DIFF):
      • Dual-channel mode: –151.8 dBFS/Hz
      • Single-channel mode: –154.4 dBFS/Hz
    • ENOB (dual channel, F IN = 2.4 GHz): 8.6 Bits
  • Buffered analog inputs with V CMI of 0 V:
    • Analog input bandwidth (–3 dB): 8 GHz
    • Usable input frequency range: > 10 GHz
    • Full-scale input voltage (V FS, default): 0.8 V PP
  • Noiseless aperture delay (t AD) adjustment:
    • Precise sampling control: 19-fs Step
    • Simplifies synchronization and interleaving
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features:
    • Automatic SYSREF timing calibration
    • Time stamp for sample marking
  • JESD204C serial data interface:
    • Maximum lane rate: 17.16 Gbps
    • Support for 64b/66b and 8b/10b encoding
    • 8b/10b modes are JESD204B compatible
  • Optional digital down-converters (DDC):
    • Complex decimation: 4x (IBW = 0.2*F S = 2.08 GHz in DES mode, 1.04 GHz per channel in dual channel mode), 8x, 16x and 32x
    • Four independent 32-Bit NCOs per DDC
  • Peak RF Input Power (Diff): +26.5 dBm (+ 27.5 dBFS, 560x fullscale power)
  • Programmable FIR filter for equalization
  • Power consumption: 4 W
  • Power supplies: 1.1 V, 1.9 V

The ADC12DJ5200-SEP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. ADC12DJ5200-SEP can be configured as a dual-channel, 5.2 GSPS ADC or single-channel, 10.4 GSPS ADC. Support of a useable input frequency range of up to 10 GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ5200-SEP uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16 Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers.

Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multichannel applications. Optional digital down converters (DDCs) are available to provide digital conversion to base-band and to reduce the interface rate. A programmable FIR filter allows on-chip equalization.

The ADC12DJ5200-SEP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. ADC12DJ5200-SEP can be configured as a dual-channel, 5.2 GSPS ADC or single-channel, 10.4 GSPS ADC. Support of a useable input frequency range of up to 10 GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ5200-SEP uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16 Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers.

Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multichannel applications. Optional digital down converters (DDCs) are available to provide digital conversion to base-band and to reduce the interface rate. A programmable FIR filter allows on-chip equalization.
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類型 標題 日期
* Data sheet ADC12DJ5200-SEP 10.4-GSPS Single-Channel or 5.2-GSPS Dual-Channel, 12-bit,RF-Sampling Analog-to-Digital Converter (ADC) datasheet PDF | HTML 2023年 10月 12日

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

ADC12DJ5200RFEVM — ADC12DJ5200RF 射頻取樣 12 位元雙 5.2-GSPS 或單 10.4-GSPS ADC 評估模組

ADC12DJ5200RF 評估模組 (EVM) 可供評估裝置 ADC12DJ5200RF 的評估。ADC12DJ5200RF 是低功耗、12 位元、雙 5.2-GSPS/單 10.4-GSPS、具有緩衝類比輸入的射頻取樣類比轉數位轉換器 (ADC)、具可編程 NCO 和降取設定 (包括未降取的 12 位元和 8 位元 ADC 輸出) 和具有 JESD204B/C 介面的整合式數位降壓轉換器。該 EVM 具有變壓器耦合類比輸入，可適應廣泛的訊號來源和頻率。

EVM 隨附 LMX2582 時鐘合成器和 LMK04828 JESD204B/C 時鐘產生器，可配置為提供適用於完整 (...)

使用指南: PDF | HTML
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開發板

TSW14J57EVM — 資料擷取/模式產生器：具有 16 個 JESD204B 通道 (1.6-15 Gbps) 的資料轉換器 EVM

TI TSW14J57評估模組 (EVM) 是新一代資料擷取卡，可用來評估全新 TI JESD204B 系列高速類比轉數位轉換器 (ADC)、高速數位轉類比轉換器 (DAC) 和類比前端 (AFE) 的性能。

安裝 Arria® 10 裝置並使用 Altera® JESD204B IP 解決方案後，TSW14J57 即可動態設定為支援所有通道速度，範圍從 1.6 Gbps 到 15 Gbps - 從 1 到 16 通道。

搭配隨附的高速資料轉換器 Pro (HSDC Pro) 圖形使用者介面 (GUI)，是一套完整系統，可擷取並評估使用 JESD204B 及/或 JESD204C 的 (...)

使用指南: PDF | HTML
要求
模擬型號

ADC12DJ5200RF IBIS and IBIS-AMI Model (Rev. A)

SLVMD65A.ZIP (49879 KB) - IBIS-AMI Model
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模擬型號

ADC12DJ5200RF S-Parameter Model

SLVMDX5.ZIP (1563 KB) - S-Parameter Model
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模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
要求
參考設計

TIDA-010274 — Space-grade discrete RF sampling transceiver reference design

This reference design incorporates a 10 GSPS dual digital-to-analog converter and a 5 GSPS dual analog-to-digital converter with active baluns on the RF interface supporting up through X-band. The design also incorporates a space-grade clocking daughter card and a space-grade power solution (...)
Design guide: PDF
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