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數據轉換器
類比轉數位轉換器 (ADC)
高速 ADC (≥10 MSPS)

ADC3664-SEP

現行

Radiation-tolerant, 30krad, 14 bit, dual 125MSPS ADC

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產品規格表

ADC3664-SEP

現行
產品規格表 立即訂購

產品詳細資料

Sample rate (max) (Msps) 125 Resolution (Bits) 14 Number of input channels 2 Interface type Serial LVDS Analog input BW (MHz) 200 Features Bypass Mode, Decimating Filter, Differential Inputs, Dual Channel, High Dynamic Range, High Performance, Internal Reference, LVDS interface, Low latency, Low power Rating Space Peak-to-peak input voltage range (V) 3.2 Power consumption (typ) (mW) 200 Architecture SAR SNR (dB) 78 ENOB (Bits) 12.6 SFDR (dB) 84 Operating temperature range (°C) -55 to 105 Radiation, TID (typ) (krad) 30 Radiation, SEL (MeV·cm2/mg) 43
Sample rate (max) (Msps) 125 Resolution (Bits) 14 Number of input channels 2 Interface type Serial LVDS Analog input BW (MHz) 200 Features Bypass Mode, Decimating Filter, Differential Inputs, Dual Channel, High Dynamic Range, High Performance, Internal Reference, LVDS interface, Low latency, Low power Rating Space Peak-to-peak input voltage range (V) 3.2 Power consumption (typ) (mW) 200 Architecture SAR SNR (dB) 78 ENOB (Bits) 12.6 SFDR (dB) 84 Operating temperature range (°C) -55 to 105 Radiation, TID (typ) (krad) 30 Radiation, SEL (MeV·cm2/mg) 43
WQFN (RSB) 40 25 mm² (5 mm × 5 mm)
  • Radiation tolerant (-SEP only):
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm2/mg
    • Total ionizing dose (TID): 30krad(Si)
  • Enhanced product (-EP and -SEP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID)
    • Temperature range: –55°C to 105°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • Dual channel, 125MSPS ADC
  • 14-bit resolution (no missing codes)
  • Noise floor: –156.9dBFS/Hz
  • Low power consumption: 100mW/ch (at 125MSPS)
  • Latency: 2 clock cycles
  • Voltage reference options:
    • External: 1 to 125MSPS
    • Internal: 100 to 125MSPS
  • Input bandwidth: 200MHz (3dB)
  • INL: ±2.6 LSB; DNL: ±0.9 LSB (typical)
  • On-chip DSP (optional/bypassable)
    • Decimation by 2, 4, 8, 16, 32
    • 32-bit NCO
  • Serial LVDS digital interface (2-, 1- and 1/2-wire)
  • Small Footprint: 40 QFN (5 × 5mm) package
  • Spectral performance (fIN = 5MHz):
    • SNR: 77.5dBFS
    • SFDR: 84dBc HD2, HD3
    • SFDR: 92dBFS worst spur
  • Radiation tolerant (-SEP only):
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm2/mg
    • Total ionizing dose (TID): 30krad(Si)
  • Enhanced product (-EP and -SEP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID)
    • Temperature range: –55°C to 105°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • Dual channel, 125MSPS ADC
  • 14-bit resolution (no missing codes)
  • Noise floor: –156.9dBFS/Hz
  • Low power consumption: 100mW/ch (at 125MSPS)
  • Latency: 2 clock cycles
  • Voltage reference options:
    • External: 1 to 125MSPS
    • Internal: 100 to 125MSPS
  • Input bandwidth: 200MHz (3dB)
  • INL: ±2.6 LSB; DNL: ±0.9 LSB (typical)
  • On-chip DSP (optional/bypassable)
    • Decimation by 2, 4, 8, 16, 32
    • 32-bit NCO
  • Serial LVDS digital interface (2-, 1- and 1/2-wire)
  • Small Footprint: 40 QFN (5 × 5mm) package
  • Spectral performance (fIN = 5MHz):
    • SNR: 77.5dBFS
    • SFDR: 84dBc HD2, HD3
    • SFDR: 92dBFS worst spur

The ADC3664-xEP device is a low-noise, ultra-low power, 14-bit, 125MSPS, high-speed dual channel ADC. Designed for lowest noise performance, the device delivers a noise spectral density of -156.9dBFS/Hz combined with linearity and dynamic range. The ADC3664-xEP offers IF sampling support which makes the device designed for a wide range of applications. High-speed control loops benefit from the short latency as low as one clock cycle. The ADC consumes only 100mW/ch at 125MSPS, and the power consumption scales well with lower sampling rates.

The ADC3664-xEP uses a serial LVDS (SLVDS) interface to output the data which minimizes the number of digital interconnects. The device supports a two-lane, one-lane and half-lane option. The device supports an extended temperature range from –55°C to +105°C.

The ADC3664-xEP device is a low-noise, ultra-low power, 14-bit, 125MSPS, high-speed dual channel ADC. Designed for lowest noise performance, the device delivers a noise spectral density of -156.9dBFS/Hz combined with linearity and dynamic range. The ADC3664-xEP offers IF sampling support which makes the device designed for a wide range of applications. High-speed control loops benefit from the short latency as low as one clock cycle. The ADC consumes only 100mW/ch at 125MSPS, and the power consumption scales well with lower sampling rates.

The ADC3664-xEP uses a serial LVDS (SLVDS) interface to output the data which minimizes the number of digital interconnects. The device supports a two-lane, one-lane and half-lane option. The device supports an extended temperature range from –55°C to +105°C.
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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 ADC3664-SEP ADC3664-EP 14-Bit, 125MSPS, Low Noise, Low Power Dual Channel ADC datasheet PDF | HTML 2025/4/7
* 輻射及可靠性報告 ADC3664-SEP Single Event Effects Report PDF | HTML 2025/3/25
* 輻射及可靠性報告 ADC3664-SEP Production Flow and Reliability Report PDF | HTML 2025/3/19
* 輻射及可靠性報告 ADC3664-SEP Total Ionizing Dose (TID) Radiation Report 2025/3/19

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開發板

ADC3664EVM — 具有 SLVDS 介面的 ADC3664 雙路、14 位元、125MSPS、高 SNR、低功耗 ADC 評估模組

ADC3664 評估模組 (EVM) 專為評估 ADC3664 系列高速類比轉數位轉換器 (ADC) 所設計。本 EVM 搭載 ADC3664 晶片，該晶片為具備序列 LVDS 介面的 16 位元、雙通道 125MSPS ADC，可評估 14 位元裝置系列中的單通道或雙通道裝置。
使用指南: PDF | HTML
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開發板

ADC3664EVMCVAL — ADC3664-SP 評估模組

ADC3664 評估模組 (EVM) 專為評估 ADC3664-SP 高速類比轉數位轉換器 (ADC) 所設計。本 EVM 搭載 ADC3664-SP 晶片，該晶片為具備串列 LVDS 介面的 18 位元、雙通道 125MSPS ADC。
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