AFE11612-SEP
Radiation-tolerant, 12 bit, analog front end with temperature sensors, 12 DAC and 16 ADC channels
AFE11612-SEP
- Radiation tolerant:
- Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
- Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
- Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
- Space-enhanced plastic (space
EP):
- Meets ASTM E595 outgassing specification
- Vendor item drawing (VID) V62/22614
- Military temperature range: –55°C to +125°C
- One fabrication, assembly, and test site
- Gold bond wire, NiPdAu lead finish
- Wafer lot traceability
- Extended product life cycle
- 12 monotonic, 12-bit DACs
- 0 V to 5 V output range
- DAC shutdown to user-defined level
- 16 input, 12-bit SAR ADC
- High sample rate: 500 kSPS
- 16 single-ended inputs or 2 differential and 12 single-ended inputs
- Programmable out-of-range alarms
- Eight GPIO pins
- Internal 2.5-V reference
- Two remote temperature sensors
- Internal temperature sensor
- Configurable SPI and I 2C interface
- 2.7-V to 5.5-V operation
The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.
The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.
The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | AFE11612-SEP Radiation-Tolerant, Analog Monitor and Controller With Multichannel ADC, DACs, and Temperature Sensors datasheet (Rev. A) | PDF | HTML | 2023/9/15 | ||
| * | 輻射及可靠性報告 | AFE11612-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) | 2023/1/26 | |||
| * | 輻射及可靠性報告 | AFE11612-SEP Reliability and Production Flow Chart (Rev. A) | PDF | HTML | 2022/12/23 | ||
| 應用說明 | Biasing GaN and LDMOS RF Power Amplifiers in Aerospace Applications Using AFE11612-SEP (Rev. B) | PDF | HTML | 2026/5/26 | |||
| Product overview | TI Space Qualified Temperature Sensor Product Selection Guide (Rev. A) | PDF | HTML | 2025/1/22 | |||
| 應用說明 | Laser Biasing and Optical Communication Applications With the AFE11612-SEP (Rev. A) | PDF | HTML | 2024/7/23 | |||
| 證書 | AFE11612EVM EU RoHS Declaration of Conformity (DoC) | 2023/2/1 |
設計與開發
如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。
AFE11612EVM — AFE11612-SEP 評估模組，適用於具有溫度感測器的 12 位元類比前端 (AFE)
AFE11612EVM 是簡單易用的平台，旨在評估 AFE11612‑SEP 裝置的功能和性能。AFE11612‑SEP 是一款高度整合、低功耗、完整類比監視器和控制器，包括 16 通道 (12 位元) 類比轉數位轉換器 (ADC)、12 通道 (12 位元) 數位轉類比轉換器 (DAC)、八個 GPIO、兩個遠程溫度感測器通道，以及一個本機溫度感測器通道。該裝置也配備輸入超出範圍警報，並支援具 5-V 和 3-V 邏輯的 SPI 與 I2C 通訊協定的可配置序列介面。
AFE11612EVM-GUI — GUI for the AFE11612 evaluation module (EVM)
AFE11612-SEP-SIM-TOOL — AFE11612-SEP 的 IBIS 檔案
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| HTQFP (PAP) | 64 | Ultra Librarian |
訂購與品質
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。