首頁 數據轉換器 整合式與特殊功能資料轉換器 整合式精密 ADC 與 DAC
首頁
數據轉換器
整合式與特殊功能資料轉換器
整合式精密 ADC 與 DAC

AFE11612-SEP

現行

具溫度感測器和 12 DAC 和 16 ADC 通道的耐輻射 12 位元類比前端

立即訂購
產品規格表

AFE11612-SEP

現行
產品規格表 立即訂購

產品詳細資料

Number of ADC channels 16 ADC resolution (Bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
Number of ADC channels 16 ADC resolution (Bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
HTQFP (PAP) 64 144 mm² 12 x 12
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.
open-in-new 尋找其它 整合式精密 ADC 與 DAC
下載 觀看有字幕稿的影片 影片
Information

要求更多資訊

提供完整的產品規格表。立即索取

您可能會感興趣的類似產品

open-in-new 比較替代產品
功能相似於所比較的產品
最新 AFE20408 現行 八通道功率放大器監視器和控制器，具有輸出開關和電流感測器 Bipolar output range and integrated current-shunt monitor

技術文件

star =TI 所選的此產品重要文件
找不到結果。請清除您的搜尋條件，然後再試一次。
檢視所有 8
類型 標題 日期
* Data sheet AFE11612-SEP Radiation-Tolerant, Analog Monitor and Controller With Multichannel ADC, DACs, and Temperature Sensors datasheet (Rev. A) PDF | HTML 2023年 9月 15日
* Radiation & reliability report AFE11612-SEP Single-Event Effects (SEE) Test Report (Rev. A) 2023年 9月 1日
* Radiation & reliability report AFE11612-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) 2023年 1月 26日
* Radiation & reliability report AFE11612-SEP Reliability and Production Flow Chart (Rev. A) PDF | HTML 2022年 12月 23日
Application note Laser Biasing and Optical Communication Applications with the AFE11612-SEP PDF | HTML 2023年 8月 30日
Application note Biasing GaN and LDMOS RF Power Amplifiers in Aerospace Apps Using AFE11612-SEP PDF | HTML 2023年 6月 29日
EVM User's guide AFE11612EVM User's Guide PDF | HTML 2023年 3月 14日
Certificate AFE11612EVM EU RoHS Declaration of Conformity (DoC) 2023年 2月 1日

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

AFE11612EVM — 適用於具有溫度感測器的 12 位元類比前端 (AFE) 的 AFE11612-SEP 評估模組

AFE11612EVM 是簡單易用的平台，旨在評估 AFE11612‑SEP 裝置的功能和性能。AFE11612‑SEP 是一款高度整合、低功耗、完整類比監視器和控制器，包括 16 通道 (12 位元) 類比轉數位轉換器 (ADC)、12 通道 (12 位元) 數位轉類比轉換器 (DAC)、八個 GPIO、兩個遠程溫度感測器通道，以及一個本機溫度感測器通道。該裝置也配備輸入超出範圍警報，並支援具 5-V 和 3-V 邏輯的 SPI 與 I2C 通訊協定的可配置序列介面。

使用指南: PDF | HTML
要求
模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
要求
封裝 引腳 下載
HTQFP (PAP) 64 檢視選項
適用 TI 的評估品項標準條款與條件。

訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 資格摘要
  • 進行中可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點

建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。

支援與培訓

內含 TI 工程師技術支援的 TI E2E™ 論壇

以英文檢視所有論壇主題

內容係由 TI 和社群貢獻者依「現狀」提供，且不構成 TI 規範。檢視使用條款。

若有關於品質、封裝或訂購 TI 產品的問題，請參閱 TI 支援。​​​​​​​​​​​​​​

影片