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SN74LV393A-EP

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增強型產品雙路 4 位元二進位計數器

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SN74LV393A-EP

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產品規格表 立即訂購

產品詳細資料

Function Counter Bits (#) 4 Technology family LV-A Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Input type Standard CMOS Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 105 Rating HiRel Enhanced Product
Function Counter Bits (#) 4 Technology family LV-A Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Input type Standard CMOS Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 105 Rating HiRel Enhanced Product
TSSOP (PW) 14 32 mm² 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 105°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 5.5-V VCC Operation
  • Max tpd of 14.5 ns at 5 V
  • Typical VOLP (Output Ground Bounce)
       <0.8 V at VCC = 3.3 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot)
       >2.3 V at VCC = 3.3 V, TA = 25°C
  • Ioff Supports Partial-Power-Down-Mode Operation
  • Dual 4-Bit Binary Counters With Individual Clocks
  • Direct Clear for Each 4-Bit Counter
  • Can Significantly Improve System Densities by Reducing Counter Package Count by 50 Percent

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 105°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 5.5-V VCC Operation
  • Max tpd of 14.5 ns at 5 V
  • Typical VOLP (Output Ground Bounce)
       <0.8 V at VCC = 3.3 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot)
       >2.3 V at VCC = 3.3 V, TA = 25°C
  • Ioff Supports Partial-Power-Down-Mode Operation
  • Dual 4-Bit Binary Counters With Individual Clocks
  • Direct Clear for Each 4-Bit Counter
  • Can Significantly Improve System Densities by Reducing Counter Package Count by 50 Percent

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74LV393A contains eight flip-flops and additional gating to implement two individual 4-bit counters in a single package. This device is designed for 2-V to 5.5-V VCC operation.

This device comprises two independent 4-bit binary counters, each having a clear (CLR) and a clock (CLK)\ input. The device changes state on the negative-going transition of the CLK\ pulse. N-bit binary counters can be implemented with each package, providing the capability of divide by 256. The SN74LV393A has parallel outputs from each counter stage so that any submultiple of the input count frequency is available for system timing signals.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

The SN74LV393A contains eight flip-flops and additional gating to implement two individual 4-bit counters in a single package. This device is designed for 2-V to 5.5-V VCC operation.

This device comprises two independent 4-bit binary counters, each having a clear (CLR) and a clock (CLK)\ input. The device changes state on the negative-going transition of the CLK\ pulse. N-bit binary counters can be implemented with each package, providing the capability of divide by 256. The SN74LV393A has parallel outputs from each counter stage so that any submultiple of the input count frequency is available for system timing signals.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
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重要文件 類型 標題 格式選項 日期
* Radiation & reliability report SN74LV393ATPWREP Reliability Report 2013年 9月 5日
* Data sheet SN74LV393A-EP datasheet (Rev. A) 2004年 5月 11日

訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中的可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點