AEC-Q100 qualified for automotive applications:
- Device temperature grade 1: -40°C to +125°C
- Device HBM ESD classification level 2
- Device CDM ESD classification level C4B
Available in wettable flank QFN package
Latching logic with known power-up state provides consistent start-up behavior
Wide operating range of 1.65V to 5.5V
5.5V tolerant input pins
Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):
- Up translation:
  - 1.2V to 1.8V
  - 1.5V to 2.5V
  - 1.8V to 3.3V
  - 3.3V to 5.0V
- Down translation:
  - 5.0V, 3.3V, 2.5V to 1.8V
  - 5.0V, 3.3V to 2.5V
  - 5.0V to 3.3V
Up to 150Mbps with 5V or 3.3V VCC
Supports standard function pinout
Latch-up performance exceeds 250mAper JESD 17

AEC-Q100 qualified for automotive applications:
- Device temperature grade 1: -40°C to +125°C
- Device HBM ESD classification level 2
- Device CDM ESD classification level C4B
Available in wettable flank QFN package
Latching logic with known power-up state provides consistent start-up behavior
Wide operating range of 1.65V to 5.5V
5.5V tolerant input pins
Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):
- Up translation:
  - 1.2V to 1.8V
  - 1.5V to 2.5V
  - 1.8V to 3.3V
  - 3.3V to 5.0V
- Down translation:
  - 5.0V, 3.3V, 2.5V to 1.8V
  - 5.0V, 3.3V to 2.5V
  - 5.0V to 3.3V
Up to 150Mbps with 5V or 3.3V VCC
Supports standard function pinout
Latch-up performance exceeds 250mAper JESD 17

The SN74LV8T164-Q1 device contains an 8-bit shift register with AND-gated serial inputs and an asynchronous clear (CLR) input. The gated serial (A and B) inputs permit complete control over incoming data; a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock (CLK) pulse. A high-level input enables the other input, which then determines the state of the first flip-flop. Data at the serial inputs can be changed while CLK is high or low, provided the minimum set-up time requirements are met. Clocking occurs on the low-to-high-level transition of CLK.

The input is designed with a reduced threshold circuit to support up translation when the supply voltage is larger than the input voltage. Additionally, the 5V tolerant input pins enable down translation when the input voltage is larger than the supply voltage. The output level is always referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.

The SN74LV8T164-Q1 device contains an 8-bit shift register with AND-gated serial inputs and an asynchronous clear (CLR) input. The gated serial (A and B) inputs permit complete control over incoming data; a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock (CLK) pulse. A high-level input enables the other input, which then determines the state of the first flip-flop. Data at the serial inputs can be changed while CLK is high or low, provided the minimum set-up time requirements are met. Clocking occurs on the low-to-high-level transition of CLK.

The input is designed with a reduced threshold circuit to support up translation when the supply voltage is larger than the input voltage. Additionally, the 5V tolerant input pins enable down translation when the input voltage is larger than the supply voltage. The output level is always referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.

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*	Data sheet	SN74LV8T164-Q1 Automotive 8-Bit Parallel-Load Shift Register With Logic-Level Shifter datasheet	PDF \| HTML	2024年 3月 22日

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SN74LV8T164-Q1

具有邏輯位準移位器的車用、1.65-V 至 5.5-V 8 位元、平行輸出序列移位暫存器

SN74LV8T164-Q1

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