首頁 邏輯和電壓轉換 邏輯閘 XOR (exclusive OR) 閘
首頁
邏輯和電壓轉換
邏輯閘
XOR (exclusive OR) 閘

SN74LVC86A-EP

現行

增強型產品 4 通道、2 輸入、2-V 至 3.6-V XOR (exclusive OR) 閘

立即訂購
產品規格表

SN74LVC86A-EP

現行
立即訂購

產品詳細資料

Technology family LVC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 Input type Standard CMOS IOH (max) (mA) -24 Output type Push-Pull Features High speed (tpd 10-50ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family LVC Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 Input type Standard CMOS IOH (max) (mA) -24 Output type Push-Pull Features High speed (tpd 10-50ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm) TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C and –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Operates From 2 V to 3.6 V
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 4.6 ns at 3.3 V
  • Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot) >2 V at VCC = 3.3 V, TA = 25°C

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C and –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Operates From 2 V to 3.6 V
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 4.6 ns at 3.3 V
  • Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot) >2 V at VCC = 3.3 V, TA = 25°C

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74LVC86A quadruple 2-input exclusive-OR gate is designed for 2.7-V to 3.6-V VCC operation.

The device performs the Boolean function Y = A B or Y = AB + AB in positive logic.

A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.

The SN74LVC86A quadruple 2-input exclusive-OR gate is designed for 2.7-V to 3.6-V VCC operation.

The device performs the Boolean function Y = A B or Y = AB + AB in positive logic.

A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.
filter 尋找其它 XOR (exclusive OR) 閘
下載 觀看有字幕稿的影片 影片

技術文件

找不到結果。請清除您的搜尋條件，然後再試一次。
檢視所有 4
重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN74LVC86A-EP datasheet (Rev. B) 2007/7/25
* 輻射及可靠性報告 SN74LVC86AMDREP Reliability Report 2011/10/5
* 輻射及可靠性報告 SN74LVC86AQDREP Reliability Report 2011/10/5
* VID SN74LVC86A-EP VID V6204670 2016/6/21

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

封裝 針腳 CAD 符號、佔位空間與 3D 模型
SOIC (D) 14 Ultra Librarian
TSSOP (PW) 14 Ultra Librarian
適用 TI 的評估品項標準條款與條件。

訂購與品質

支援與培訓

內含 TI 工程師技術支援的 TI E2E™ 論壇

以英文檢視所有論壇主題

內容係由 TI 和社群貢獻者依「現狀」提供，且不構成 TI 規範。檢視使用條款。

若有關於品質、封裝或訂購 TI 產品的問題，請參閱 TI 支援。​​​​​​​​​​​​​​

影片