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TPD2E001-Q1

現行

具 VCC 接腳且適用 USB 2.0 的車用雙 1.5-pF、5.5-V、±8-kV ESD 防護二極體

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產品規格表

TPD2E001-Q1

現行
產品規格表 立即訂購

產品詳細資料

Package name SOT-5X3 Peak pulse power (8/20 μs) (max) (W) 100 Vrwm (V) 5.5 Bi-/uni-directional Uni-Directional Number of channels 2 IO capacitance (typ) (pF) 1.5 Clamping voltage (V) 16 Breakdown voltage (min) (V) 11
Package name SOT-5X3 Peak pulse power (8/20 μs) (max) (W) 100 Vrwm (V) 5.5 Bi-/uni-directional Uni-Directional Number of channels 2 IO capacitance (typ) (pF) 1.5 Clamping voltage (V) 16 Breakdown voltage (min) (V) 11
SOT-5X3 (DRL) 5 2.56 mm² 1.6 x 1.6
  • Qualified for Automotive Applications
  • ESD Protection Exceeds
    • ±15-kV Human-Body Model (HBM)
    • ±8-kV IEC 61000-4-2 Contact Discharge
    • ±15-kV IEC 61000-4-2 Air-Gap Discharge
  • Low 1.5-pF Input Capacitance
  • Low 1-nA (Max) Leakage Current
  • 0.9-V to 5.5-V Supply-Voltage Range
  • Two-Channel Device
  • Space-Saving DRL Package
  • Alternate 3-, 4-, 6-Channel Options Available:
    TPD3E001, TPD4E001, and TPD6E001
  • APPLICATIONS
    • USB 2.0
    • Ethernet
    • FireWire™
    • Video
    • Cell Phones
    • SVGA Video Connections
    • Glucose Meters

FireWire is a trademark of Apple Computer, Inc.
  • Qualified for Automotive Applications
  • ESD Protection Exceeds
    • ±15-kV Human-Body Model (HBM)
    • ±8-kV IEC 61000-4-2 Contact Discharge
    • ±15-kV IEC 61000-4-2 Air-Gap Discharge
  • Low 1.5-pF Input Capacitance
  • Low 1-nA (Max) Leakage Current
  • 0.9-V to 5.5-V Supply-Voltage Range
  • Two-Channel Device
  • Space-Saving DRL Package
  • Alternate 3-, 4-, 6-Channel Options Available:
    TPD3E001, TPD4E001, and TPD6E001
  • APPLICATIONS
    • USB 2.0
    • Ethernet
    • FireWire™
    • Video
    • Cell Phones
    • SVGA Video Connections
    • Glucose Meters

FireWire is a trademark of Apple Computer, Inc.

The TPD2E001 is a low-capacitance ±15-kV ESD-protection diode array designed to protect sensitive electronics attached to communication lines. Each channel consists of a pair of diodes that steer ESD current pulses to VCC or GND. The TPD2E001 protects against ESD pulses up to ±15-kV Human-Body Model (HBM), ±8-kV Contact Discharge, and ±15-kV Air-Gap Discharge, as specified in IEC 61000-4-2. This device has a 1.5-pF capacitance per channel, making it ideal for use in high-speed data IO interfaces.

The TPD2E001 is a two-channel device intended for USB and USB 2.0 applications.

The TPD2E001 is available in the DRL package and is specified for –40°C to 85°C operation.

The TPD2E001 is a low-capacitance ±15-kV ESD-protection diode array designed to protect sensitive electronics attached to communication lines. Each channel consists of a pair of diodes that steer ESD current pulses to VCC or GND. The TPD2E001 protects against ESD pulses up to ±15-kV Human-Body Model (HBM), ±8-kV Contact Discharge, and ±15-kV Air-Gap Discharge, as specified in IEC 61000-4-2. This device has a 1.5-pF capacitance per channel, making it ideal for use in high-speed data IO interfaces.

The TPD2E001 is a two-channel device intended for USB and USB 2.0 applications.

The TPD2E001 is available in the DRL package and is specified for –40°C to 85°C operation.
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類型 標題 日期
* Data sheet TPD2E001-Q1 Low-Capacitance 2-Channel +/-15-kV ESD-Protection Array datasheet 2009年 11月 5日
Application note ESD and Surge Protection for USB Interfaces (Rev. B) PDF | HTML 2024年 1月 11日
User guide Reading and Understanding an ESD Protection Data Sheet (Rev. A) PDF | HTML 2023年 9月 19日
Application note ESD Packaging and Layout Guide (Rev. B) PDF | HTML 2022年 8月 18日
Application note ISO 10605 Road Vehicles Test Methods for Elec. Disturbances from Electrostatic D (Rev. B) PDF | HTML 2022年 8月 17日
Application note ESD Protection Layout Guide (Rev. A) PDF | HTML 2022年 4月 7日
Application brief ESD Protection for Automotive Infotainment (Rev. A) PDF | HTML 2021年 11月 12日
User guide Generic ESD Evaluation Module User's Guide (Rev. A) PDF | HTML 2021年 9月 27日
White paper Designing USB for short-to-battery tolerance in automotive environments 2016年 2月 10日
Analog Design Journal Design Considerations for System-Level ESD Circuit Protection 2012年 9月 25日

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