Automotive test

High precision automotive test equipment system integrated circuits and reference designs

Description

Our integrated circuits and reference designs help create high-precision automotive test equipment for accurate testing of all automotive subsystems during manufacturing and service of the vehicle.

New generation automotive test equipment requires:

High-speed transmit and receive signal chain solutions for automotive radar and wireless communication testing.
High-voltage and current-source measurement units for electric vehicle (EV) drivetrain systems.
High-speed protocol analyzers for serial bus testing.
High-precision spectrum analyzers for EMI/EMC compliance testing.

Technical documentation

Application notes & user guides

Application Notes (4)

Title	Type	Size (KB)	Date
Clocking Optimization for RF Sampling Analog-to-Digital Converters (Rev. A)	PDF	668 KB	07 Apr 2021
66AK2L06 JESD Attach to ADC12J4000/DAC38J84 Getting Started Guide (Rev. B)	PDF	8.6 MB	20 Jun 2016
Principles of Data Acquisition and Conversion (Rev. A)	PDF	132 KB	16 Apr 2015
Signal Chain Noise Figure Analysis	PDF	615 KB	29 Oct 2014

Product bulletin & white papers

White Papers (3)

Title	Type	Size (MB)	Date
Voltage-reference impact on total harmonic distortion	PDF	3.07 MB	01 Aug 2016
Minimum Power Specifications for High-Performance ADC Power-Supply Designs	PDF	2.13 MB	31 Mar 2016
Direct RF conversion: From vision to reality	PDF	1.13 MB	11 Feb 2015

Technical articles

Support & training

TI E2E™ forums with technical support from TI engineers

Search our extensive online knowledge base where millions of technical questions and answers are available 24/7.

Search answers from TI experts

Content is provided 'AS IS' by the respective TI and Community contributors and does not constitute TI specifications.
See terms of use.

If you have questions about quality, packaging, or ordering TI products visit our Support page.