Source measurement unit (SMU)

Test & measurement Source Measurement Unit (SMU) integrated circuits and reference designs

Description

Our integrated circuits and reference designs help to create high precision source measurement units (SMU) for accurate testing and characterization of semiconductors or other devices.

New generation source measurement units require:

  • High voltage, current source and measurement capabilities.
  • High accuracy force and measurement capabilities with wide dynamic range.
  • Intuitive interface to adjust parameters and monitor agent usage.
  • Pulse mode support to eliminate device self-heating.
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Technical documentation

Application notes & user guides

Application Notes (5)

Title Type Size (KB) Date
PDF 448 KB 28 Jan 2021
PDF 518 KB 17 Dec 2020
PDF 2.69 MB 30 Sep 2020
PDF 78 KB 14 Jun 2017
PDF 132 KB 16 Apr 2015

Technical articles

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