Source measurement unit (SMU)

Test & measurement Source Measurement Unit (SMU) integrated circuits and reference designs

Description

Our integrated circuits and reference designs help to create high precision source measurement units for accurate testing and characterization of semiconductors or other devices.

New generation source measurement units require:

High voltage and current source and measurement capabilities
High accuracy force and measurement capabilities with wide dynamic range
Intuitive interface to adjust parameters and monitor agent usage
Pulse mode support to eliminate device self-heating

Technical documentation

Application notes & user guides

Application Notes (4)

Title	Type	Size (KB)	Date
MUX-friendly precision operational amplifiers (Rev. A)	PDF	217 KB	11 Feb 2019
Zero-drift Amplifiers: Features and Benefits (Rev. B)	PDF	107 KB	31 Aug 2018
Improving Resolution of SAR ADC	PDF	78 KB	14 Jun 2017
Principles of Data Acquisition and Conversion (Rev. A)	PDF	132 KB	16 Apr 2015

Product bulletin & white papers

White Papers (5)

Title	Type	Size (MB)	Date
Accounting for delay from multiple sources in delta-sigma ADCs (Rev. A)	PDF	688 KB	01 Feb 2018
Fully integrated signal and power isolation – applications and benefits	PDF	1.57 MB	10 Feb 2017
Enabling Faster, Smarter, and More Robust Solutions for SAR ADSx With multiSPI	PDF	149 KB	08 Nov 2016
Voltage-reference impact on total harmonic distortion	PDF	3.07 MB	01 Aug 2016
Minimum Power Specifications for High-Performance ADC Power-Supply Designs	PDF	2.13 MB	31 Mar 2016

Technical articles

Support & training

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