LCD test

LCD Test Equipment integrated circuits and reference designs

Description

Our integrated circuits and reference designs help you create high-density, high-performance, multi-channel liquid crystal display (LCD) test equipment that minimizes channel-to-channel variations due to reference voltage loading, clocking and power.

New generation LCD test equipment often requires:

Simultaneous high-precision, high-voltage, multi-channel measurement capabilities.
Minimum channel-to-channel variation during measurement.
High-current drive precision voltage generation for the shorting bar test.
Highly-integrated, efficient and low external machine interface (EMI) power architectures.

Technical documentation

Application notes & user guides

Application Notes (4)

Title	Type	Size (KB)	Date
Zero-Drift Amplifiers: Features and Benefits (Rev. C)	PDF	448 KB	28 Jan 2021
Improving Resolution of SAR ADC	PDF	78 KB	14 Jun 2017
Fully-Differential Amplifiers (Rev. E)	PDF	867 KB	19 Sep 2016
Principles of Data Acquisition and Conversion (Rev. A)	PDF	132 KB	16 Apr 2015

Product bulletin & white papers

White Papers (1)

Title	Type	Size (MB)	Date
Voltage reference selection basics white paper (Rev. A)	PDF	1.2 MB	23 Oct 2018

Technical articles

Support & training

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