LCD test

LCD Test Equipment integrated circuits and reference designs

Description

Our integrated circuits and reference designs help you create high-density, high-performance, multi-channel liquid crystal display (LCD) test equipment that minimizes channel-to-channel variations due to reference voltage loading, clocking and power.

New generation LCD test equipment often requires:

Simultaneous high-precision, high-voltage, multi-channel measurement capabilities
Minimum channel-to-channel variation during measurement
High current drive precision voltage generation for the shorting bar test
Highly integrated, efficient and low EMI power architectures

Technical documentation

Application notes & user guides

Application Notes (4)

Title	Type	Size (KB)	Date
Zero-drift Amplifiers: Features and Benefits (Rev. B)	PDF	107 KB	31 Aug 2018
Improving Resolution of SAR ADC	PDF	78 KB	14 Jun 2017
Fully-Differential Amplifiers (Rev. E)	PDF	867 KB	19 Sep 2016
Principles of Data Acquisition and Conversion (Rev. A)	PDF	132 KB	16 Apr 2015

Product bulletin & white papers

White Papers (1)

Title	Type	Size (MB)	Date
Voltage reference selection basics white paper (Rev. A)	PDF	1.2 MB	23 Oct 2018

Technical articles

Support & training

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