LCD test

LCD Test Equipment integrated circuits and reference designs

Description

Our integrated circuits and reference designs help you create high-density, high-performance, multi-channel liquid crystal display (LCD) test equipment that minimizes channel-to-channel variations due to reference voltage loading, clocking and power.

New generation LCD test equipment often requires:

Simultaneous high-precision, high-voltage, multi-channel measurement capabilities
Minimum channel-to-channel variation during measurement
High current drive precision voltage generation for the shorting bar test
Highly integrated, efficient and low EMI power architectures

Technical documentation

Application notes & user guides

Application Notes (5)

Title	Type	Size (KB)	Date
Zero-drift Amplifiers: Features and Benefits (Rev. B)	PDF	107 KB	31 Aug 2018
Improving Resolution of SAR ADC	PDF	78 KB	14 Jun 2017
Fully-Differential Amplifiers (Rev. E)	PDF	867 KB	19 Sep 2016
Principles of Data Acquisition and Conversion (Rev. A)	PDF	132 KB	16 Apr 2015
Load Sharing Concepts: Implementation for Large-Signal Applications	PDF	219 KB	05 Oct 2011

Product bulletin & white papers

White Papers (3)

Title	Type	Size (MB)	Date
Voltage reference selection basics white paper (Rev. A)	PDF	1.2 MB	23 Oct 2018
Comparing the Merits of Integrated Power Modules versus Discrete Regulators (Rev. B)	PDF	1.25 MB	15 Sep 2016
SiP Power Modules White Paper	PDF	1011 KB	26 Jan 2016

Technical articles

Support & training

Search our extensive online knowledge base where millions of technical questions and answers are available 24/7.

Search answers from TI experts

Content is provided 'AS IS' by the respective TI and Community contributors and does not constitute TI specifications.
See terms of use.

If you have questions about quality, packaging, or ordering TI products visit our Support page.