Semiconductor test

Memory and Semiconductor Test Equipment integrated circuits and reference designs

Description

Our integrated circuits and reference designs help you create high accuracy testers at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

    Next generation semiconductor testers often require:

  • Highest levels of speed and accuracy through data acquisition channels
  • Tight temperature controls to minimize measurement drift
  • Precise reference voltage generation to improve measurement accuracy
  • Low jitter clock distribution to maximize SNR performance
  • Highly integrated, low-height power modules minimizing board-to-board spacing
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Technical documentation

Application notes & user guides

Application Notes (9)

Title Type Size (KB) Date
PDF 668 KB 07 Apr 2021
PDF 1.11 MB 30 Mar 2021
PDF 448 KB 28 Jan 2021
PDF 518 KB 17 Dec 2020
PDF 78 KB 14 Jun 2017
PDF 177 KB 03 Jan 2017
PDF 132 KB 16 Apr 2015
PDF 327 KB 10 Sep 2010
PDF 285 KB 28 Feb 2005

Product bulletin & white papers

White Papers (3)

Title Type Size (MB) Date
PDF 688 KB 01 Feb 2018
PDF 3.07 MB 01 Aug 2016
PDF 2.13 MB 31 Mar 2016

Technical articles

Support & training

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