Semiconductor test

Products and reference designs

Semiconductor test

Block diagram

Overview

Our integrated circuits and reference designs help you create high-accuracy semiconductor test designs at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

Design requirements:

    Next-generation semiconductor test designs often require:

  • Highest levels of speed and accuracy through data acquisition channels.
  • Tight temperature controls to minimize measurement drift.
  • Precise reference voltage generation to improve measurement accuracy.
  • Low jitter clock distribution to maximize signal-to-noise ratio (SNR) performance.
  • Highly-integrated, low-height power modules minimizing board-to-board spacing.

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Block diagram

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Technical documentation

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Type Title Date
Technical articles How semiconductor technologies are changing automotive lighting roadmaps 24 Oct 2019
Application note How to Select Precision Amplifiers for Semiconductor Testers (Rev. A) PDF | HTML 08 May 2022
Technical articles Untangling electric vehicle chargers – Getting started 07 Jul 2015
Technical articles Don’t power your FPGA like this! 03 Nov 2016
Technical articles How smart amps are bringing high-fidelity audio into the smart home 03 May 2021

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