Wireless communication test equipment (WCTE) use configurable radio frequency (RF) front end to test wireless devices to ensure compliance with multiple standards. Our integrated circuits and reference designs help you create a WCTE signal chain that has a high level of integration and low power as channel count increases.
Modern wireless communications test designs require:
|697 KB||07 Apr 2021|
|82 KB||12 Jan 2016|
|327 KB||10 Sep 2010|
|4.63 MB||12 Aug 2016|
|3.33 MB||19 Mar 2015|
|1.13 MB||11 Feb 2015|
|Name||Part #||Company||Software/Tool Type|
|Data capture/pattern generator: data converter EVM with 16 JESD204B lanes from 1.6-15Gbps||TSW14J57EVM||Texas Instruments||Evaluation board|
|Data capture/pattern generator: data converter EVM with 8 JESD204B lanes from 0.6-12.5Gbps||TSW14J56EVM||Texas Instruments||Evaluation board|
|Data capture/pattern generator: data converter EVM with 8 JESD204B lanes from 0.6-6.5Gbps||TSW14J50EVM||Texas Instruments||Evaluation board|
Search our extensive online knowledge base where millions of technical questions and answers are available 24/7.Search answers from TI experts
Content is provided 'AS IS' by the respective TI and Community contributors and does not constitute TI specifications.
If you have questions about quality, packaging, or ordering TI products visit our Support page.