DLPU125 june   2023

 

  1.   1
  2.   DLPC910 Apps FPGA User’s Guide
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Welcome
  5. 2Overview
    1. 2.1 Purpose
    2. 2.2 Apps FPGA Hardware Target
  6. 3Interfaces
    1. 3.1  LVDS high speed data interface to DLPC910
      1. 3.1.1 DLP9000X and DLP9000XUV
      2. 3.1.2 DLP6500
    2. 3.2  Data Load Control Signals to DLPC910
    3. 3.3  DMD Reset and Block Clear Signals to the DLPC910
    4. 3.4  DLPC910 Initialization and Controller Reset Signals
    5. 3.5  Apps FPGA Reset Signal - apps_resetz
    6. 3.6  DLPC910 Status-Info Signals
    7. 3.7  USB GPIF (Interface)
      1. 3.7.1 Apps FPGA Register Address Read-Write Transactions
        1. 3.7.1.1 Apps FPGA Register Address Transaction
        2. 3.7.1.2 Apps FPGA Register Data Write Transaction
        3. 3.7.1.3 Apps FPGA Register Data Read Transaction
      2. 3.7.2 FIFO Write Transaction
    8. 3.8  DLPLCRC910EVM Dip Switch (SW2)
    9. 3.9  VC-707 Dip Switch (SW2)
    10. 3.10 VC-707 Push Button Switches
    11. 3.11 VC-707 Status LEDs
    12. 3.12 DLPLCRC910EVM Apps FPGA Test Points
  7. 4Operation
    1. 4.1 Initialization
      1. 4.1.1 Initialization Prompts
      2. 4.1.2 Init Routine
      3. 4.1.3 GPIO Status LEDs
      4. 4.1.4 Errors
    2. 4.2 Test Pattern Generator (TPG) and Apps Loader - DLP Control
      1. 4.2.1 Test Pattern Generator (TPG)
      2. 4.2.2 DMD Data Buffer
      3. 4.2.3 DMD Load State Machine
      4. 4.2.4 DMD Reset State Machine
      5. 4.2.5 DMD Load Parameters
      6. 4.2.6 Synchronization Pulse
    3. 4.3 User DLP Control
      1. 4.3.1 DLP6500 (1920 x 1080) User Image Display Example (Global)
      2. 4.3.2 DLP9000X (2560 x 1600) User Image Display Example (Global)
      3. 4.3.3 Load4 - Using with DLP6500 DMD
      4. 4.3.4 USB GPIF FIFO Data Writes
      5. 4.3.5 External Trigger
    4. 4.4 USB GPIF (Operation)
    5. 4.5 Clocks and Resets
      1. 4.5.1 Reference Clocks
      2. 4.5.2 Clk50 and Clk100
      3. 4.5.3 DLP Clocks
      4. 4.5.4 USB GPIF Clock
      5. 4.5.5 Logic Resets
      6. 4.5.6 Clock Domain Crossings (CDC)
    6. 4.6 Switch Debounce
  8. 5USB GPIF Registers
    1. 5.1 Register Definitions
      1. 5.1.1  Status (0x000C)
      2. 5.1.2  Data Loading Control (0x0010)
      3. 5.1.3  Test Pattern Control (0x0014)
      4. 5.1.4  Test Row Address (0x0018) - [Unused]
      5. 5.1.5  Loader Reset Type (0x001C)
      6. 5.1.6  Type and Version (0x0020)
      7. 5.1.7  User Image Buffer Write Settings (0x0024)
      8. 5.1.8  USB GPIF FIFO Read Burst Size (0x0028) - [Obsolete]
      9. 5.1.9  User Row Command Register (0x002C)
      10. 5.1.10 User Block Command Register (0x0030)
      11. 5.1.11 Loader Row Control (0x0034)
      12. 5.1.12 Loader Load Interval (0x0038)
      13. 5.1.13 Loader Expose Time (0x003C)
      14. 5.1.14 Address Write (0x003F) - [Unused]
      15. 5.1.15 Loader Control (0x0040)
      16. 5.1.16 Park [PWR_FLOAT] (0x0044)
      17. 5.1.17 External Trigger Status (0x0048)
      18. 5.1.18 FPGA Build Date (0x0080)
      19. 5.1.19 Major-Minor Revision (0x0084)
      20. 5.1.20 Fixed Value FPGA Identifier (0x0088)
      21. 5.1.21 Test Register (0x008C)
  9. 6FPGA Configuration
  10. 7Apps FPGA Source Files and Compilation
    1. 7.1 Design Tools
    2. 7.2 Source Files
      1. 7.2.1 Primary VHDL and IP Modules
      2. 7.2.2 Modules with Multiple Instantiations
      3. 7.2.3 VHDL Packages
      4. 7.2.4 Vivado Constraints
      5. 7.2.5 Memory IP Initialization Files
        1. 7.2.5.1 Look Up Tables
    3. 7.3 Building the Apps FPGA Code
      1. 7.3.1 Source Code
        1. 7.3.1.1 Source Folder
      2. 7.3.2 Creating the Vivado Project
      3. 7.3.3 Compiling the Design
      4. 7.3.4 Simulation
        1. 7.3.4.1 Test Benches
        2. 7.3.4.2 Steps to Simulate a Module
  11. 8Related Documentation from Texas Instruments
  12. 9Appendix
    1. 9.1 Abbreviations and Acronyms
    2. 9.2 Information About Cautions and Warnings

5.1.3 Test Pattern Control (0x0014)

Address BITS Description Default R/W
0x0014 (31:12) TPG cycle interval(19:0) – defines test pattern display interval for the test pattern generator. LSB = 1 ms(1) 0x7D0 R/W
11 not used
10 not used
9 not used
8 CEN – 1 = test pattern cycling. 0 = cycling disabled(2) ‘1’ R/W
(7:0) Test pattern select(7:0)(3) 0x00 R/W
(1) 1 ms is the step size for this value. A value of 0x000 results in unpredictable behavior.
(2) When pattern cycling is enabled, the test pattern generator cycles through writing patterns 0x00 through 0x0E into the test pattern buffer at the rate given by the TPG cycle interval. When pattern cycling is disabled, the test pattern generator writes the selected pattern into the test pattern buffer.
(3) Test pattern select chooses test pattern to display when test pattern cycling is disabled:
  • 0x00 – full ON pattern
  • 0x01 – full OFF pattern
  • 0x02 – ANSI checkerboard
  • 0x03 – single pixel grid line pattern with single pixel outside border
  • 0x04 – west to east single pixel diagonal lines
  • 0x05 – east to west single pixel diagonal lines
  • 0x06 – horizontal lines
  • 0x07 – vertical lines
  • 0x08 – load4 checkerboard
  • 0x09 – checkerboard
  • 0x0A – inverted checkerboard
  • 0x0B – 1x1 horizontal lines
  • 0x0C – 1x1 vertical lines
  • 0x0D – random noise pattern
  • 0x0E – block boundary checkerboard
  • 0x0F – user defined pattern (loaded through USB/GPIF)
  • 0xFF-0x10 – not used