4 改訂履歴
Changes from E Revision (October 2015) to F Revision
- Changed maximum VDD voltage from 5.5 V to 7 V in the Absolute Maximum Ratings tableGo
- Changed bit description of Config Register bit 0Go
Changes from D Revision (October 2013) to E Revision
- Added 「ESD 定格」表、「機能説明」セクション、「ノイズ特性」セクション、「デバイスの機能モード」セクション、「アプリケーションと実装」セクション、「電源に関する推奨事項」セクション、「レイアウト」セクション、「デバイスおよびドキュメントのサポート」セクション、「メカニカル、パッケージ、および注文情報」セクションGo
- タイトル、「概要」セクション、「特長」セクション、および前面ページのブロック図を変更Go
- Changed title from Product Family to Device Comparison Table and deleted Package Designator columnGo
- Updated descriptions and changed name of I/O column in Pin Configurations and Functions tableGo
- Changed digital input voltage range and added minimum specification for TJ in Absolute Maximum Ratings table Go
- Added Differential input impedance specification in Electrical CharacteristicsGo
- Changed Condition statement in Timing Requirements: Serial InterfaceGo
- Moved tCSDOD, tDOPD, and tCSDOZ parameters from Timing Requirements to Switching CharacteristicsGo
- Moved tCSDOD and tCSDOZ values from MIN column to MAX column.Go
- Deleted Noise vs Input Signal, Noise vs Supply Voltage, and Noise vs Input Signal plotsGo
- Updated Overview section and deleted "Gain = 2/3, 1, 2, 4, 8, or 16" from Functional Block DiagramGo
- Updated Analog Inputs sectionGo
- Updated Full-Scale Range (FSR) and LSB Size sectionGo
- Updated Reset and Power Up sectionGo
- Updated 32-Bit Data Transmission Cycle sectionGo
- Updated Register Maps sectionGo
- Updated Application Information sectionGo
- Updated Figure 48Go
- Deleted Thermocouple Measurement With Cold Junction Temperature section, and moved Figure 50 to Typical Application sectionGo
Changes from C Revision (February 2013) to D Revision
- Deleted デバイスの図Go
- Changed bit 1 to NOP0 in Figure 44Go
- Changed NOP bit description in Figure 44: changes bits[2:0] to bits [2:1] and changed NOP to NOP[1:0]Go
Changes from B Revision (August 2012) to C Revision
- ドキュメントを現行の標準に変更Go
- Changed 「特長」の「低消費電流」の箇条書き項目に、シングル・ショット・モードの副項目をGo
- Changed 「特長」の内蔵温度センサについての箇条書き項目をGo
- Changed 「概要」セクションGo
- Changed Product Family tableGo
- Changed Function column name in Pin Descriptions tableGo
- Changed Analog Input, Full-scale input voltage range parameter row in Electrical Characteristics tableGo
- Changed footnotes 1 and 2 in Electrical Characteristics tableGo
- Changed conditions for Electrical Characteristics tableGo
- Changed System Performance, Integral nonlinearity and Gain Error test conditions in Electrical Characteristics tableGo
- Changed first two Temperature Sensor, Temperature sensor accuracy parameter test conditions in Electrical Characteristics tableGo
- Changed Power-Supply Requirements, Supply current parameter test conditions in Electrical Characteristics tableGo
- Changed footnote 3 of Timing Requirements: Serial Interface Timing tableGo
- Updated Figure 3Go
- Updated Figure 9Go
- Changed title of Figure 11 to Figure 14Go
- Updated Figure 15 and Figure 33Go
- Updated Figure 20Go
- Changed conditions in Figure 21 to Figure 25Go
- Changed comments in Figure 27 to Figure 31Go
- Changed Overview sectionGo
- Updated Multiplexer sectionGo
- Changed Full-Scale Input sectionGo
- Changed Voltage Reference sectionGo
- Changed Oscillator sectionGo
- Added multiplication points to example equations in Converting from Digital Codes to Temperature sectionGo
- Changed Serial Interface, Chip Select, Serial Clock, Data Input, and Data Output and Data Ready sectionsGo
- Changed Data Retrieval sectionGo
- Changed Registers sectionGo
- Changed Aliasing, Reset and Power Up, Operating Modes, and Duty Cycling for Low Power sectionsGo
- Updated Figure 50Go
Changes from A Revision (July 2011) to B Revision
- Added (VSSOP) to titles of Figure 20 to Figure 25Go
- Added Figure 26 to Figure 31Go