SN74HC166A-EP

ACTIVE

Product details

Configuration Parallel-in, Serial-out Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 29 IOL (max) (mA) 4 IOH (max) (mA) -4 Supply current (max) (µA) 80 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 85 Rating HiRel Enhanced Product
Configuration Parallel-in, Serial-out Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 29 IOL (max) (mA) 4 IOH (max) (mA) -4 Supply current (max) (µA) 80 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 85 Rating HiRel Enhanced Product
SOIC (D) 16 59.4 mm² 9.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Wide Operating Voltage Range of 2 V to 6 V
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 13 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Synchronous Load
  • Direct Overriding Clear
  • Parallel-to-Serial Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Wide Operating Voltage Range of 2 V to 6 V
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 13 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Synchronous Load
  • Direct Overriding Clear
  • Parallel-to-Serial Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

This parallel-in or serial-in, serial-out register features gated clock (CLK, CLK INH) inputs and an overriding clear (CLR)\ input. The parallel-in or serial-in modes are established by the shift/load (SH/LD\) input. When high, SH/LD\ enables the serial (SER) data input and couples the eight flip-flops for serial shifting with each clock (CLK) pulse. When low, the parallel (broadside) data inputs are enabled, and synchronous loading occurs on the next clock pulse. During parallel loading, serial data flow is inhibited. Clocking is accomplished on the low-to-high-level edge of CLK through a 2-input positive-NOR gate, permitting one input to be used as a clock-enable or clock-inhibit function. Holding either CLK or CLK INH high inhibits clocking; holding either low enables the other clock input. This allows the system clock to be free running, and the register can be stopped on command with the other clock input. CLK INH should be changed to the high level only when CLK is high. CLR\ overrides all other inputs, including CLK, and resets all flip-flops to zero.

This parallel-in or serial-in, serial-out register features gated clock (CLK, CLK INH) inputs and an overriding clear (CLR)\ input. The parallel-in or serial-in modes are established by the shift/load (SH/LD\) input. When high, SH/LD\ enables the serial (SER) data input and couples the eight flip-flops for serial shifting with each clock (CLK) pulse. When low, the parallel (broadside) data inputs are enabled, and synchronous loading occurs on the next clock pulse. During parallel loading, serial data flow is inhibited. Clocking is accomplished on the low-to-high-level edge of CLK through a 2-input positive-NOR gate, permitting one input to be used as a clock-enable or clock-inhibit function. Holding either CLK or CLK INH high inhibits clocking; holding either low enables the other clock input. This allows the system clock to be free running, and the register can be stopped on command with the other clock input. CLK INH should be changed to the high level only when CLK is high. CLR\ overrides all other inputs, including CLK, and resets all flip-flops to zero.

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Type Title Date
* Data sheet SN74HC166A-EP datasheet 06 Jan 2004
* VID SN74HC166A-EP VID V6204690 21 Jun 2016
* Radiation & reliability report SN74HC166AIDREP Reliability Report 22 Dec 2014
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 15 Dec 2022
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 26 Jul 2021
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dec 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
User guide Signal Switch Data Book (Rev. A) 14 Nov 2003
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 Aug 2002
Application note CMOS Power Consumption and CPD Calculation (Rev. B) 01 Jun 1997
Application note Designing With Logic (Rev. C) 01 Jun 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 Oct 1996
Application note Live Insertion 01 Oct 1996
Application note SN54/74HCT CMOS Logic Family Applications and Restrictions 01 May 1996
Application note Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc 01 Apr 1996

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SOIC (D) 16 Ultra Librarian

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