SN54AC00-SP Quadruple 2-Input Positive-NAND Gates | TI.com

SN54AC00-SP (ACTIVE)

Quadruple 2-Input Positive-NAND Gates

Quadruple 2-Input Positive-NAND Gates  - SN54AC00-SP
 

Radiation Studies
View TID Radiation Report (typical performance): 100kRad(Si)

Description

The SN54AC00 device contains four independent 2-input NAND gates. Each gate performs the Boolean function of Y = A • B or Y = A + B in positive logic.

Features

  • 5962R87549:
    • Radiation Hardness Assurance (RHA) up to TID
      TID 100 krad (Si)
    • SEL/SEU Immune to 86 MeV
  • 5962-87549:
    • Total Ionizing Dose 50 krad (Si)
  • 2-V to 6-V VCC Operation
  • Inputs Accept Voltages to 6 V
  • Max tpd of 7 ns at 5 V

View more

Parametrics Compare all products in Gate Products

 
Technology Family
VCC (Min) (V)
VCC (Max) (V)
Bits (#)
Schmitt Trigger
F @ Nom Voltage (Max) (Mhz)
ICC @ Nom Voltage (Max) (mA)
tpd @ Nom Voltage (Max) (ns)
IOL (Max) (mA)
Input Type
Output Type
Rating
Operating Temperature Range (C)
Package Group
Package Size: mm2:W x L (PKG)
SN54AC00-SP
AC    
2    
6    
4    
No    
100    
0.04    
11
7    
24    
CMOS    
CMOS    
Space    
-55 to 125    
CDIP
CFP    
See datasheet (CDIP)
See datasheet (CFP)    

Other qualified versions of SN54AC00-SP

Version Part Number Definition
Catalog SN54AC00 TI's standard catalog product

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