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SN54AC00-SP

ACTIVE

Space 4-ch, 2-input, 2-V to 6-V NAND gates

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Data sheet

SN54AC00-SP

ACTIVE
Data sheet Order now

Product details

Technology family AC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating Space Operating temperature range (°C) -55 to 125
Technology family AC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating Space Operating temperature range (°C) -55 to 125
CDIP (J) 14 130.4652 mm² 19.56 x 6.67 CFP (W) 14 58.023 mm² 9.21 x 6.3 DIESALE (KGD) — See data sheet
  • 5962R87549:
    • Radiation hardness assurance (RHA) up to TID 100 krad (Si)
    • SEL immune to 86 MeV×cm2/mg
  • 5962-87549:
    • Total ionizing dose 50 krad (Si)
  • 2 V to 6 V VCC operation
  • Inputs accept voltages to 6 V
  • Maximum tpd of 7 ns at 5 V
  • 5962R87549:
    • Radiation hardness assurance (RHA) up to TID 100 krad (Si)
    • SEL immune to 86 MeV×cm2/mg
  • 5962-87549:
    • Total ionizing dose 50 krad (Si)
  • 2 V to 6 V VCC operation
  • Inputs accept voltages to 6 V
  • Maximum tpd of 7 ns at 5 V

The SN54AC00 device contains four independent 2-input NAND gates. Each gate performs the Boolean function of Y = A • B or Y = A + B in positive logic.

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The SN54AC00 device contains four independent 2-input NAND gates. Each gate performs the Boolean function of Y = A • B or Y = A + B in positive logic.

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Technical documentation

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* Data sheet SN54AC00-SP Radiation Hardened Quad 2 Input NAND Gate datasheet (Rev. C) PDF | HTML 04 Apr 2022
* Radiation & reliability report 54AC00-SP Radiation Assured Devices 21 Apr 2016

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