It is recommended to perform thermal simulations at the system level with the worst-case device power consumption.
| PARAMETER |
DESCRIPTION |
℃/W(1)(2) |
AIR FLOW (m/s)(3) |
| RΘJC |
Junction-to-case |
6.5 |
N/A |
| RΘJB |
Junction-to-board |
6.6 |
N/A |
| RΘJA |
Junction-to-free air |
19.9 |
0 |
| RΘJA |
Junction-to-moving air |
13.7 |
1 |
| 12.5 |
2 |
| 11.9 |
3 |
| ΨJT |
Junction-to-package top |
0.13 |
0 |
| 0.38 |
1 |
| 0.52 |
2 |
| 0.61 |
3 |
| ΨJB |
Junction-to-board |
6.5 |
0 |
| 6.0 |
1 |
| 5.9 |
2 |
| 5.8 |
3 |
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Packages
(2) ℃/W = degrees Celsius per watt
(3) m/s = meters per second