SLUSD36 September   2017

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Description (continued)
  6. Pin Configuration and Functions
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Power-On-Reset (POR)
      2. 8.3.2  Device Power Up from Battery without Input Source
      3. 8.3.3  Power Up from Input Source
        1. 8.3.3.1 Power Up REGN Regulation
        2. 8.3.3.2 Poor Source Qualification
        3. 8.3.3.3 Input Source Type Detection
          1. 8.3.3.3.1 PSEL Pins Sets Input Current Limit in bq25600C
        4. 8.3.3.4 Input Voltage Limit Threshold Setting (VINDPM Threshold)
        5. 8.3.3.5 Converter Power-Up
      4. 8.3.4  Host Mode and Standalone Power Management
        1. 8.3.4.1 Host Mode and Default Mode in bq25600C
      5. 8.3.5  Power Path Management
      6. 8.3.6  Battery Charging Management
        1. 8.3.6.1 Autonomous Charging Cycle
        2. 8.3.6.2 Battery Charging Profile
        3. 8.3.6.3 Charging Termination
        4. 8.3.6.4 Charging Safety Timer
        5. 8.3.6.5 Narrow VDC Architecture
      7. 8.3.7  Shipping Mode
        1. 8.3.7.1 BATFET Disable Mode (Shipping Mode)
        2. 8.3.7.2 BATFET Enable (Exit Shipping Mode)
      8. 8.3.8  Status Outputs (PG, STAT)
        1. 8.3.8.1 Power Good indicator (PG Pin and PG_STAT Bit)
        2. 8.3.8.2 Charging Status indicator (STAT)
        3. 8.3.8.3 Interrupt to Host (INT)
      9. 8.3.9  Protections
        1. 8.3.9.1 Voltage and Current Monitoring in Converter Operation
          1. 8.3.9.1.1 Voltage and Current Monitoring in Buck Mode
            1. 8.3.9.1.1.1 Input Overvoltage (ACOV)
        2. 8.3.9.2 Thermal Regulation and Thermal Shutdown
          1. 8.3.9.2.1 Thermal Protection in Buck Mode
        3. 8.3.9.3 Battery Protection
          1. 8.3.9.3.1 Battery overvoltage Protection (BATOVP)
      10. 8.3.10 Serial interface
        1. 8.3.10.1 Data Validity
        2. 8.3.10.2 START and STOP Conditions
        3. 8.3.10.3 Byte Format
        4. 8.3.10.4 Acknowledge (ACK) and Not Acknowledge (NACK)
        5. 8.3.10.5 Slave Address and Data Direction Bit
        6. 8.3.10.6 Single Read and Write
        7. 8.3.10.7 Multi-Read and Multi-Write
    4. 8.4 Register Maps
      1. 8.4.1  REG00
      2. 8.4.2  REG01
      3. 8.4.3  REG02
      4. 8.4.4  REG03
      5. 8.4.5  REG04
      6. 8.4.6  REG05
      7. 8.4.7  REG06
      8. 8.4.8  REG07
      9. 8.4.9  REG08
      10. 8.4.10 REG09
      11. 8.4.11 REG0A
      12. 8.4.12 REG0B
  9. Application and Implementation
    1. 9.1 Application information
    2. 9.2 Typical Application Diagram
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Inductor Selection
        2. 9.2.2.2 input Capacitor
        3. 9.2.2.3 Output Capacitor
    3. 9.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Community Resources
    2. 12.2 Trademarks
    3. 12.3 Electrostatic Discharge Caution
    4. 12.4 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Device and Documentation Support

Community Resources

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    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

Trademarks

E2E is a trademark of Texas Instruments.

Electrostatic Discharge Caution

esds-image

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

Glossary

SLYZ022TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.