SLAS555B June 2012 – September 2018 CC430F5123 , CC430F5125 , CC430F5143 , CC430F5145 , CC430F5147 , CC430F6147
PRODUCTION DATA.
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| EI | Integral linearity error | 1.4 V ≤ (VEREF+ – VEREF-)min ≤ 1.6 V | –1.0 | +1.0 | LSB | |
| 1.6 V < (VEREF+ – VEREF-)min ≤ VAVCC | –1.0 | +1.0 | ||||
| ED | Differential linearity error | (VEREF+ – VEREF-)min ≤ (VEREF+ – VEREF-),
CVEREF+ = 20 pF |
–1.0 | +1.0 | LSB | |
| EO | Offset error | (VEREF+ – VEREF-)min ≤ (VEREF+ – VEREF-),
Internal impedance of source RS < 100 Ω, CVEREF+ = 20 pF |
–1.0 | +1.0 | LSB | |
| EG | Gain error, external reference | (VEREF+ – VEREF-)min ≤ (VEREF+ – VEREF-),
CVEREF+ = 20 pF |
–1.0 | +1.0 | LSB | |
| Gain error, external reference, buffered | –5 | +5 | %VREF | |||
| Gain error, internal reference | See (1) | –1.5 | +1.5 | |||
| ET | Total unadjusted error, external reference | (VEREF+ – VEREF-)min ≤ (VEREF+ – VEREF-),
CVEREF+ = 20 pF |
–2.0 | ±1.0 | +2.0 | LSB |
| Total unadjusted error, external reference, buffered | –5 | ±1.0 | +5 | |||
| Total unadjusted error, internal reference | See (1) | –1.5 | ±1.0 | +1.5 | %VREF | |