SLVSGJ9A May   2024  – October 2025 DRV7308

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Absolute Maximum Ratings
  7. ESD Ratings
  8. Recommended Operating Conditions
  9. Thermal Information
  10. Electrical Characteristics
  11. 10Timing Diagrams
  12. 11Typical Characteristics
  13. 12Detailed Description
    1. 12.1 Overview
    2. 12.2 Functional Block Diagram
    3. 12.3 Feature Description
      1. 12.3.1 Output Stage
      2. 12.3.2 Input Control Logic
      3. 12.3.3 ENABLE (EN) Pin Function
      4. 12.3.4 Temperature Sensor Output (VTEMP)
      5. 12.3.5 Brake Function
      6. 12.3.6 Slew Rate Control (SR)
      7. 12.3.7 Dead Time
      8. 12.3.8 Current Limit Functionality (ILIMIT)
      9. 12.3.9 Pin Diagrams
        1. 12.3.9.1 Four-Level Input Pin
        2. 12.3.9.2 Open-Drain Pin
        3. 12.3.9.3 Logic-Level Input Pin (Internal Pulldown)
    4. 12.4 Protections
      1. 12.4.1 GVDD Undervoltage Lockout
      2. 12.4.2 Bootstrap Undervoltage Lockout
      3. 12.4.3 Current Limit Protection
      4. 12.4.4 GaNFET Overcurrent Protection
      5. 12.4.5 Thermal Shutdown (OTS)
  14. 13Application and Implementation
    1. 13.1 Application Information
    2. 13.2 Typical Application
      1. 13.2.1 Application
        1. 13.2.1.1 Application Information
      2. 13.2.2 Application Curves
  15. 14Layout
    1. 14.1 Layout Guidelines
    2. 14.2 Layout Example
  16. 15Revision History
  17. 16Device and Documentation Support
    1. 16.1 Documentation Support
      1. 16.1.1 Related Documentation
    2. 16.2 Receiving Notification of Documentation Updates
    3. 16.3 Support Resources
    4. 16.4 Trademarks
    5. 16.5 Electrostatic Discharge Caution
    6. 16.6 Glossary
  18. 17Mechanical, Packaging, and Orderable Information
    1. 17.1 Tape and Reel Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Protections

The DRV7308 integrates GaN FET overcurrent protection (GaN_OCP), overtemperature shutdown (OTSD), GVDD and bootstrap supply undervoltage protection (GVDD_UVLO and VBOOT_UVLO), and current limit (ILIMIT). Table 12-2 summarizes various faults in details.

Table 12-2 Fault Action and Response
FAULT CONDITION REPORT GAN BRIDGE RECOVERY
GaN overcurrent protection (GaN_OCP)(1) Low-side GaN FET current > IOCP_GaN nFAULT All GaN pre-drivers turn off resulting Hi-Z (all three phases) Latched. 20μs to 40μs toggling pulse on EN pin or GVDD power recycling
SLx overcurrent limit (ILIMIT) V SLx> VILIMIT nFAULT All GaN pre-drivers turn off resulting Hi-Z (all three phases) Retry(2). After a fault clear time > tF_CLR
GVDD undervoltage VGVDD < VGVDD_UV nFAULT All GaN pre-drivers turn off resulting Hi-Z (all three phases) Automatic: VGVDD > VGVDD_UVLO
Boot supply undervoltage (voltage between BOOTx and OUTx pin) VBOOTx < VBST_UV - The impacted high-side GaN pre-drivers turn off. All other GaNFETs continue to operate. Automatic: VBOOTx > VBST_UV
Thermal shutdown (OTSD) TJ > TSD, for low-side GaNFET nFAULT All GaN pre-drivers turn off resulting Hi-Z (all three phases) Automatic TJ < TSD
TJ > TSD, for high-side GaNFET Latched. 20μs to 40μs toggling pulse on EN pin or GVDD power recycling
Over current detection for low-side GaN FETs only.
PWM inputs (INHx, INLx) must be low before the falling edge of nFAULT.
Note: The GaN over current protection (GaN OCP) is available for low-side GaN FETs.
WARNING: The recovery condition of SL over current limit (ILIMIT) is valid if the PWM inputs (INHx, INLx) are low before the falling edge of nFAULT.