SLOS581J may   2008  – august 2023 ISO3080 , ISO3082 , ISO3086 , ISO3088

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Insulation Specifications
    6. 6.6  Safety-Related Certifications
    7. 6.7  Safety Limiting Values
    8. 6.8  Electrical Characteristics: Driver
    9. 6.9  Electrical Characteristics: Receiver
    10. 6.10 Supply Current
    11. 6.11 Switching Characteristics: Driver
    12. 6.12 Switching Characteristics: Receiver
    13. 6.13 Insulation Characteristics Curves
    14. 6.14 Typical Characteristics
  8. 7 Parameter Measurement Information
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagrams
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
      1. 8.4.1 Device I/O Schematics
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  14. 13Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • DW|16
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7 Parameter Measurement Information

GUID-A534B0F4-4392-4B45-B74D-FF335882DABF-low.gifFigure 7-1 Driver VOD Test and Current Definitions
GUID-1DAB93D0-E32A-4653-BD60-CD9DF5CC8B1C-low.gifFigure 7-2 Driver VOD With Common-Mode Loading Test Circuit
Note: Unless otherwise stated, test circuits are shown for half-duplex devices, ISO3082 and ISO3088. For full-duplex devices, the driver output pins are Y and Z.
GUID-05FBE604-6883-4322-9FA5-C1B5AB02DA3B-low.gif Figure 7-3 Test Circuit and Waveform Definitions For The Driver Common-Mode Output Voltage
GUID-3A97D51E-2562-4BCE-AB84-01258AC28A78-low.gif Figure 7-4 Driver Switching Test Circuit and Voltage Waveforms
GUID-43DE6135-FA9B-4F5C-B354-57AEA21ADCC5-low.gif Figure 7-5 Driver High-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
GUID-AF7AB770-2E5B-4A8E-8D93-0034F08A8507-low.gif Figure 7-6 Driver Low-Level Output Enable and Disable Time Test Circuit and Voltage Waveform
GUID-CC1E5C4E-C0DB-4DCF-8D65-EDC4C522E6CE-low.gif Figure 7-7 Receiver Voltage and Current Definitions
GUID-E0128604-BB42-4C0C-BFCC-A796D26A789D-low.gif Figure 7-8 Receiver Switching Test Circuit and Waveforms
GUID-4AC04161-CAC8-40FE-86A9-95F061FF6786-low.gif Figure 7-9 Receiver Enable Test Circuit and Waveforms, Data Output High
GUID-EC5F34AB-78C4-4EA9-AA52-57A2E9FCA940-low.gif Figure 7-10 Receiver Enable Test Circuit and Waveforms, Data Output Low
GUID-89A50DFF-3B9F-4B3D-85EC-143F3E4DDC7D-low.gif Figure 7-11 Transient Overvoltage Test Circuit
GUID-91EC0620-07A4-462B-9DE2-3F3E39B6A17B-low.gif Figure 7-12 Half-Duplex Common-Mode Transient Immunity Test Circuit
GUID-BC5BA2FF-0924-4EE4-8808-6083E8BB45E9-low.gif Figure 7-13 Full-Duplex Common-Mode Transient Immunity Test Circuit