SLLSEA2D December   2011  – May 2015 SN65HVD255 , SN65HVD256 , SN65HVD257

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Device Options
  6. Pin Configuration and Functions
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Power Dissipation
    7. 7.7 Switching Characteristics
    8. 7.8 Typical Characteristics
  8. Parameter Measurement Information
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 TXD Dominant Timeout (DTO)
      2. 9.3.2 RXD Dominant Timeout (SN65HVD257)
      3. 9.3.3 Thermal Shutdown
      4. 9.3.4 Undervoltage Lockout
      5. 9.3.5 FAULT Pin (SN65HVD257)
      6. 9.3.6 Unpowered Device
      7. 9.3.7 Floating Pins
      8. 9.3.8 CAN Bus Short-Circuit Current Limiting
    4. 9.4 Device Functional Modes
      1. 9.4.1 Operating Modes
      2. 9.4.2 Can Bus States
      3. 9.4.3 Normal Mode
      4. 9.4.4 Silent Mode
      5. 9.4.5 Digital Inputs and Outputs
        1. 9.4.5.1 5-V VCC Only Devices (SN65HVD255 and SN65HVD257)
        2. 9.4.5.2 5-V VCC With VRXD RXD Output Supply Devices (SN65HVD256)
        3. 9.4.5.3 5-V VCC with FAULT Open-Drain Output Device (SN65HVD257)
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Bus Loading, Length, and Number of Nodes
    2. 10.2 Typical Applications
      1. 10.2.1 Typical 5-V Microcontroller Application
        1. 10.2.1.1 Design Requirements
          1. 10.2.1.1.1 CAN Termination
        2. 10.2.1.2 Detailed Design Procedure
          1. 10.2.1.2.1 Example: Functional Safety Using the SN65HVD257 in a Redundant Physical Layer CAN Network Topology
        3. 10.2.1.3 Application Curves
      2. 10.2.2 Typical 3.3-V Microcontroller Application
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Related Links
    2. 13.2 Trademarks
    3. 13.3 Electrostatic Discharge Caution
    4. 13.4 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7 Specifications

7.1 Absolute Maximum Ratings(1)(2)

MIN MAX UNIT
VCC Supply voltage –0.3 6.1 V
VRXD RXD Output supply voltage SN65HVD256 –0.3 6 and VRXD ≤ VCC + 0.3 V
VBUS CAN Bus I/O voltage (CANH, CANL) –27 40 V
VLogic_Input Logic input pin voltage (TXD, S) –0.3 6 V
VLogic_Output Logic output pin voltage (RXD) SN65HVD255, SN65HVD257 –0.3 6 V
VLogic_Output Logic output pin voltage (RXD) SN65HVD256 –0.3 6 and VI ≤ VRXD + 0.3 V
IO(RXD) RXD (Receiver) output current 12 mA
IO(FAULT) FAULT output current SN65HVD257 20 mA
TJ Operating virtual junction temperature (see Power Dissipation) –40 150 °C
TA Ambient temperature (see Power Dissipation) –40 125 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal.

7.2 ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) All pins ±2500 V
CAN bus pins (CANH, CANL)(2) ±12000
Charged-device model (CDM), per JEDEC specification JESD22-C101(3) All pins ±750
Machine model All pins ±250
IEC 61400-4-2 according to GIFT-ICT CAN EMC test spec(4) CAN bus pins (CANH, CANL) to GND ±8000
ISO7637 Transients according to GIFT - ICT CAN EMC test spec(5) CAN bus pins (CANH, CANL) Pulse 1 –100
Pulse 2 +75
Pulse 3a –150
Pulse 3b +100
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) Test method based upon JEDEC Standard 22 Test Method A114, CAN bus pins stressed with respect to GND.
(3) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(4) IEC 61000-4-2 is a system level ESD test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions. Different system level configurations may lead to different results.
(5) ISO7637 is a system level transient test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions. Different system level configurations may lead to different results.

7.3 Recommended Operating Conditions

MIN MAX UNIT
VCC Supply voltage 4.5 5.5 V
VRXD RXD supply (SN65HVD256 only) 2.8 5.5
VI or VIC CAN bus terminal voltage (separately or common mode) –2 7
VID CAN bus differential voltage -6 6
VIH Logic HIGH level input (TXD, S) 2 5.5
VIL Logic LOW level input (TXD, S) 0 0.8
IOH(DRVR) CAN BUS Driver High level output current –70 mA
IOL(DRVR) CAN BUS Driver Low level output current 70
IOH(RXD) RXD pin HIGH level output current –2
IOL(RXD) RXD pin LOW level output current 2
IO(FAULT) FAULT pin LOW level output current SN65HVD257 2
TA Operational free-air temperature (see Power Dissipation) –40 125 °C

7.4 Thermal Information

THERMAL METRIC(1) SN65HVD25x UNIT
D (SOIC)
8 PINS
RθJA Junction-to-ambient thermal resistance, High-K thermal resistance(2) 107.5 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 56.7 °C/W
RθJB Junction-to-board thermal resistance 48.9 °C/W
ψJT Junction-to-top characterization parameter 12.1 °C/W
ψJB Junction-to-board characterization parameter 48.2 °C/W
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, High-K board, as specified in JESD51-7, in an environment described in JESD51-2a.

7.5 Electrical Characteristics

Over recommended operating conditions, TA = –40°C to 125°C (unless otherwise noted). SN65HVD256 device VRXD = VCC.
PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT
SUPPLY CHARACTERISTICS
ICC 5-V Supply current Normal Mode (Driving Dominant) See Figure 6, TXD = 0 V, RL = 50 Ω,
CL = open, RCM = open, S = 0 V
60 85 mA
Normal Mode (Driving Dominant – bus fault) See Figure 6, TXD = 0 V, S = 0 V,
CANH = –12 V, RL = open, CL = open,
RCM = open
130 180
Normal Mode (Driving Dominant) See Figure 6, TXD = 0 V,
RL = open (no load),
CL = open, RCM = open, S = 0 V
10 20
Normal Mode (Recessive) See Figure 6, TXD = VCC, RL = 50 Ω,
CL = open, RCM = open,
S = 0 V
10 20
Silent Mode See Figure 6, TXD = VCC, RL = 50 Ω,
CL = open, RCM = open, S = VCC
2.5 5
IRXD RXD Supply current (SN65HVD256 only) All modes RXD Floating, TXD = 0 V 500 µA
UVVCC Undervoltage detection on VCC for protected mode 3.5 4.45 V
VHYS(UVVCC) Hysteresis voltage on UVVCC 200 mV
UVRXD Undervoltage detection on VRXD for protected mode (SN65HVD256 only) 1.3 2.75 V
VHYS(UVRXD) Hysteresis voltage on UVRXD (SN65HVD256 only) 80 mV
S PIN (MODE SELECT INPUT)
VIH HIGH-level input voltage 2 V
VIL LOW-level input voltage 0.8 V
IIH HIGH-level input leakage current S = VCC = 5.5 V 7 100 µA
IIL Low-level input leakage current S = 0 V, VCC = 5.5 V –1 0 1 µA
ILKG(OFF) Unpowered leakage current S = 5.5 V, VCC = 0 V, VRXD = 0 V 7 35 100 µA
TXD PIN (CAN TRANSMIT DATA INPUT)
VIH HIGH level input voltage 2 V
VIL LOW level input voltage 0.8 V
IIH HIGH level input leakage current TXD = VCC = 5.5 V –2.5 0 1 µA
IIL Low level input leakage current TXD = 0 V, VCC = 5.5 V –100 –25 –7 µA
ILKG(OFF) Unpowered leakage current TXD = 5.5 V, VCC = 0 V, VRXD = 0 V –1 0 1 µA
CI Input Capacitance 3.5 pF
RXD PIN (CAN RECEIVE DATA OUTPUT)
VOH HIGH level output voltage See Figure 7, IO = –2 mA. For devices with VRXD supply VOH = 0.8 × VRXD 0.8 × VCC V
VOL LOW level output voltage See Figure 7, IO = 2 mA 0.4 V
ILKG(OFF) Unpowered leakage current RXD = 5.5 V, VCC = 0 V, VRXD = 0 V –1 0 1 µA
DRIVER ELECTRICAL CHARACTERISTICS
VO(D) Bus output voltage (dominant) CANH See Figure 15 and Figure 6, TXD = 0 V,
S = 0 V, RL = 60 Ω, CL = open,
RCM = open
2.75 4.5 V
CANL 0.5 2.25
VO(R) Bus output voltage (recessive) See Figure 15 and Figure 6, TXD = VCC, VRXD = VCC, S = VCC or 0 V (2), RL = open (no load), RCM = open 2 0.5 × VCC 3 V
VOD(D) Differential output voltage (dominant) See Figure 15 and Figure 6, TXD = 0 V,
S = 0 V, 45 Ω ≤ RL ≤ 65 Ω, CL = open,
RCM = 330 Ω, –2 V ≤ VCM ≤ 7 V, 4.75 V≤ VCC ≤ 5.25 V
1.5 3 V
See Figure 15 and Figure 6, TXD = 0 V, S = 0 V, 45 Ω ≤ RL ≤ 65 Ω, CL = open,
RCM = 330 Ω, –2 V ≤ VCM ≤ 7 V,
4.5 V ≤ VCC ≤ 5.5 V
1.25 3.2
VOD(R) Differential output voltage (recessive) See Figure 15 and Figure 6, TXD = VCC,
S = 0 V, RL = 60 Ω, CL = open,
RCM = open
–0.12 0.012 V
See Figure 15 and Figure 6, TXD = VCC,
S = 0 V, RL = open (no load), CL = open,
RCM = open, –40°C ≤ TA ≤ 85°C
–0.100 0.050
VSYM Output symmetry (dominant or recessive)
(VCC – VO(CANH) – VO(CANL))
See Figure 15 and Figure 6, S at 0 V,
RL = 60 Ω, CL = open, RCM = open
–0.4 0.4 V
IOS(SS)_DOM Short circuit steady-state output current, Dominant See Figure 15 and Figure 11, VCANH = 0 V, CANL = open, TXD = 0 V –160 mA
See Figure 15 and Figure 11,
VCANL = 32 V, CANH = open, TXD = 0 V
160
IOS(SS)_REC Short circuit steady-state output current, Recessive See Figure 15 and Figure 11,
–20 V ≤ VBUS ≤ 32 V, Where VBUS = CANH = CANL,
TXD = VCC, Normal and Silent Modes
–8 8 mA
CO Output capacitance See Input capacitance to ground (CI) in the following Receiver Electrical Characteristics section of this table
RECEIVER ELECTRICAL CHARACTERISTICS
VIT+ Positive-going input threshold voltage, normal mode See Figure 7, Table 5 and Table 1 900 mV
VIT– Negative-going input threshold voltage, normal mode 500 mV
VHYS Hysteresis voltage (VIT+ - VIT–) 125 mV
IIOFF(LKG) Power-off (unpowered) bus input leakage current VCANH = VCANL = 5 V,
VCC = 0 V, VRXD = 0 V
5.5 µA
CI Input capacitance to ground (CANH or CANL) TXD = VCC, VRXD = VCC,
VI = 0.4 sin (4E6 π t) + 2.5 V
25 pF
CID Differential input capacitance TXD = VCC, VRXD = VCC,
VI = 0.4 sin (4E6 π t)
10 pF
RID Differential input resistance TXD = VCC = VRXD = 5 V, S = 0 V 30 80
RIN Input resistance (CANH or CANL) 15 40
RIN(M) Input resistance matching:
[1 – RIN(CANH) / RIN(CANL)] × 100%
V(CANH) = V(CANL), –40°C ≤ TA ≤ 85°C –3% 3%
FAULT PIN (FAULT OUTPUT), SN65HVD257 ONLY
ICH Output current high level FAULT = VCC, see Figure 5 –10 10 µA
ICL Output current low level FAULT = 0.4 V, see Figure 5 5 12 mA
(1) All typical values are at 25°C and supply voltages of VCC = 5 V and VRXD = 5 V, RL = 60 Ω.
(2) For the bus output voltage (recessive) will be the same if the device is in normal mode with S pin LOW or if the device is in silent mode with the S pin HIGH.

7.6 Power Dissipation

THERMAL METRIC TEST CONDITIONS TYP UNIT
PD Average power dissipation VCC = 5 V, VRXD = 5 V, TJ = 27°C, RL = 60 Ω, S at 0 V, Input to TXD at 250 kHz, 25% duty cycle square wave, CL_RXD = 15 pF. Typical CAN operating conditions at 500 kbps with 25% transmission (dominant) rate. 115 mW
VCC = 5.5 V, VRXD = 5.5 V, TJ = 150°C, RL = 50 Ω, S at 0 V, Input to TXD at 500 kHz, 50% duty cycle square wave, CL_RXD = 15 pF.  Typical high load CAN operating conditions at 1 Mbps with 50% transmission (dominant) rate and loaded network. 268
Thermal shutdown temperature 170 °C
Thermal shutdown hysteresis 5 °C

7.7 Switching Characteristics

over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DEVICE SWITCHING CHARACTERISTICS
tPROP(LOOP1) Total loop delay, driver input (TXD) to receiver output (RXD), recessive to dominant See Figure 9, S = 0 V, RL = 60 Ω,
CL = 100 pF, CL_RXD = 15 pF
150 ns
tPROP(LOOP2) Total loop delay, driver input (TXD) to receiver output (RXD), dominant to recessive 150
IMODE Mode change time, from Normal to Silent or from Silent to Normal See Figure 8 20 µS
DRIVER SWITCHING CHARACTERISTICS
tpHR Propagation delay time, HIGH TXD to Driver Recessive See Figure 6, S = 0 V, RL = 60 Ω,
CL = 100 pF, RCM = open
50 70 ns
tpLD Propagation delay time, LOW TXD to Driver Dominant 40 70
tsk(p) Pulse skew (|tpHR – tpLD|) 10
tR Differential output signal rise time 10 30
tF Differential output signal fall time 17 30
tR(10k) Differential output signal rise time,
RL = 10 kΩ
See Figure 6, S = 0 V, RL = 10 kΩ,
CL = 10 pF, RCM = open
35 ns
tF(10k) Differential output signal fall time,
RL = 10 kΩ
100
tTXD_DTO Dominant timeout(1) See Figure 10, RL = 60 Ω, CL = open 1175 3700 µs
RECEIVER SWITCHING CHARACTERISTICS
tpRH Propagation delay time, recessive input to high output See Figure 7, CL_RXD = 15 pF 70 90 ns
tpDL Propagation delay time, dominant input to low output 70 90 ns
tR Output signal rise time 4 20 ns
tF Output signal fall time 4 20 ns
tRXD_DTO(2) Receiver dominant time out (SN65HVD257 only) See Figure 4, CL_RXD = 15 pF 1380 4200 µs
(1) The TXD dominant timeout (tTXD_DTO) disables the driver of the transceiver when the TXD has been dominant longer than tTXD_DTO, which releases the bus lines to recessive, thus preventing a local failure from locking the bus dominant. The driver may only transmit dominant again after TXD has been returned HIGH (recessive). While this protects the bus from local faults locking the bus dominant, it limits the minimum data rate possible. The CAN protocol allows a maximum of eleven successive dominant bits (on TXD) for the worst case, where five successive dominant bits are followed immediately by an error frame. This, along with the tTXD_DTO minimum, limits the minimum bit rate. The minimum bit rate may be calculated by: Minimum Bit Rate = 11 / tTXD_DTO = 11 bits / 1175 µs = 9.4 kbps.
(2) The RXD timeout (tRXD_DTO) disables the RXD output in the case that the bus has been dominant longer than tRXD_DTO, which releases RXD pin to the recessive state (high), thus preventing a dominant bus failure from permanently keeping the RXD pin low. The RXD pin will automatically resume normal operation once the bus has been returned to a recessive state. While this protects the protocol controller from a permanent dominant state, it limits the minimum data rate possible. The CAN protocol allows a maximum of eleven successive dominant bits (on RXD) for the worst case, where five successive dominant bits are followed immediately by an error frame. This, along with the tRXD_DTO minimum, limits the minimum bit rate. The minimum bit rate may be calculated by: Minimum Bit Rate = 11 / tRXD_DTO = 11 bits / 1380 µs = 8 kbps.

7.8 Typical Characteristics

SN65HVD255 SN65HVD256 SN65HVD257 D001_SLLSEA2.gifFigure 1. Differential Output Voltage vs Supply Voltage
SN65HVD255 SN65HVD256 SN65HVD257 C001_SLLSEI3.pngFigure 3. Typical Transceiver Loop Delay vs Bus Loading
SN65HVD255 SN65HVD256 SN65HVD257 D002_SLLSEA2.gifFigure 2. Differential Output Voltage vs Ambient Temperature