SLCS114F November   1983  – June 2025 TLC372

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Description
  4. 3 Device Comparison Table
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Recommended Operating Conditions
    3. 5.3 Electrical Characteristics
    4. 5.4 Switching Characteristics
    5. 5.5 Electrical Characteristics
  7. 6 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagrams
    3. 7.3 Feature Description
    4. 7.4 Device Functional Modes
      1. 7.4.1 Input
      2. 7.4.2 ESD Protection
      3. 7.4.3 Unused Inputs
      4. 7.4.4 Open-Drain Output
      5. 7.4.5 Hysteresis
        1. 7.4.5.1 Inverting Comparator With Hysteresis
        2. 7.4.5.2 Non-Inverting Comparator With Hysteresis
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Basic Comparator Definitions
        1. 8.1.1.1 Operation
        2. 8.1.1.2 Propagation Delay
        3. 8.1.1.3 Overdrive and Underdrive Voltage
    2. 8.2 Typical Applications
      1. 8.2.1 Window Comparator
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9.5 Electrostatic Discharge Caution

TLC372 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.