The separation between the input conductor and the Hall sensor die due to the TMCS1133 construction provides inherent galvanic isolation between package pins 1 and 2 on the high-voltage input side, and package pins 3 through 10 on the low-voltage output side. Insulation capability is defined according to certification agency definitions and using industry-standard test methods as defined in Section 6.6. Assessment of device lifetime working voltages follow the IEC 60747-17 standard for basic and reinforced insulation, requiring time-dependent dielectric breakdown (TDDB) data-projection are based on projected failure rates of less than 1 part per million (ppm) for reinforced insulation and less than 1000ppm for basic insulation, and a minimum insulation lifetime of 30 years. For reinforced insulation, the IEC 60747-17 standard also requires additional safety margins of 20% for working voltage, and 50% for insulation lifetime, translating into a minimum required lifetime of 30 years at 800V_RMS for the TMCS1133.

Figure 8-2 shows the intrinsic capability of the isolation barrier to withstand high-voltage stress over the lifetime of the device. Based on the TDDB data, the intrinsic capability of these devices is 670V_RMS with a lifetime > 20 years. Other factors such as operating environment and pollution degree can further limit the working voltage of the component in an end system.

Figure 8-2 Insulation Lifetime