Refer to the PDF data sheet for device specific package drawings
Figure 5-1 and Figure 5-2 are a typical representation of the relationship between frequency and current consumption/power on the device. The operational test from Table 5-1 was run across frequency at Vmax and high temperature. Actual results will vary based on the system implementation and conditions.
Leakage current will increase with operating temperature in a nonlinear manner. The difference in VDD current between TYP and MAX conditions can be seen in Figure 5-3. The current consumption in HALT mode is primarily leakage current as there is no active switching if the internal oscillator has been powered down.
Figure 5-3 shows the typical leakage current across temperature. The device was placed into HALT mode under nominal voltage conditions.