JAJSP39A May   2022  – December 2022 ADS1285

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements: 1.65 V ≤ IOVDD ≤ 1.95 V and 2.7 V ≤ IOVDD ≤ 3.6 V
    7. 6.7 Switching Characteristics: 1.65V ≤ IOVDD ≤ 1.95V and 2.7 V ≤ IOVDD ≤ 3.6 V
    8. 6.8 Timing Diagrams
    9. 6.9 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 Noise Performance
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Analog Input
      2. 8.3.2 PGA and Buffer
        1. 8.3.2.1 Programmable Gain Amplifier (PGA)
        2. 8.3.2.2 Buffer Operation (PGA Bypass)
      3. 8.3.3 Voltage Reference Input
      4. 8.3.4 IOVDD Power Supply
      5. 8.3.5 Modulator
        1. 8.3.5.1 Modulator Overdrive
      6. 8.3.6 Digital Filter
        1. 8.3.6.1 Sinc Filter Section
        2. 8.3.6.2 FIR Filter Section
        3. 8.3.6.3 Group Delay and Step Response
          1. 8.3.6.3.1 Linear Phase Response
          2. 8.3.6.3.2 Minimum Phase Response
        4. 8.3.6.4 HPF Stage
      7. 8.3.7 Clock Input
      8. 8.3.8 GPIO
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power Modes
      2. 8.4.2 Power-Down Mode
      3. 8.4.3 Reset
      4. 8.4.4 Synchronization
        1. 8.4.4.1 Pulse-Sync Mode
        2. 8.4.4.2 Continuous-Sync Mode
      5. 8.4.5 Sample Rate Converter
      6. 8.4.6 Offset and Gain Calibration
        1. 8.4.6.1 OFFSET Register
        2. 8.4.6.2 GAIN Register
        3. 8.4.6.3 Calibration Procedure
    5. 8.5 Programming
      1. 8.5.1 Serial Interface
        1. 8.5.1.1 Chip Select (CS)
        2. 8.5.1.2 Serial Clock (SCLK)
        3. 8.5.1.3 Data Input (DIN)
        4. 8.5.1.4 Data Output (DOUT)
        5. 8.5.1.5 Data Ready (DRDY)
      2. 8.5.2 Conversion Data Format
      3. 8.5.3 Commands
        1. 8.5.3.1  Single Byte Command
        2. 8.5.3.2  WAKEUP: Wake Command
        3. 8.5.3.3  STANDBY: Software Power-Down Command
        4. 8.5.3.4  SYNC: Synchronize Command
        5. 8.5.3.5  RESET: Reset Command
        6. 8.5.3.6  Read Data Direct
        7. 8.5.3.7  RDATA: Read Conversion Data Command
        8. 8.5.3.8  RREG: Read Register Command
        9. 8.5.3.9  WREG: Write Register Command
        10. 8.5.3.10 OFSCAL: Offset Calibration Command
        11. 8.5.3.11 GANCAL: Gain Calibration Command
    6. 8.6 Register Map
      1. 8.6.1 Register Descriptions
        1. 8.6.1.1 ID/SYNC: Device ID, SYNC Register (Address = 00h) [Reset = xxxx0000b]
        2. 8.6.1.2 CONFIG0: Configuration Register 0 (Address = 01h) [Reset = 12h]
        3. 8.6.1.3 CONFIG1: Configuration Register 1 (Address = 02h) [Reset = 00h]
        4. 8.6.1.4 HPF0, HPF1: High-Pass Filter Registers (Address = 03h, 04h) [Reset = 32h, 03h]
        5. 8.6.1.5 OFFSET0, OFFSET1, OFFSET2: Offset Calibration Registers (Address = 05h, 06h, 07h) [Reset = 00h, 00h, 00h]
        6. 8.6.1.6 GAIN0, GAIN1, GAIN2: Gain Calibration Registers (Address = 08h, 09h, 0Ah) [Reset = 00h, 00h, 40h]
        7. 8.6.1.7 GPIO: Digital Input/Output Register (Address = 0Bh) [Reset = 000xx000b]
        8. 8.6.1.8 SRC0, SRC1: Sample Rate Converter Registers (Address = 0Ch, 0Dh) [Reset = 00h, 80h]
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curves
    3. 9.3 Power Supply Recommendations
      1. 9.3.1 Analog Power Supplies
      2. 9.3.2 Digital Power Supply
      3. 9.3.3 Grounds
      4. 9.3.4 Thermal Pad
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  10. 10Device and Documentation Support
    1. 10.1 Receiving Notification of Documentation Updates
    2. 10.2 サポート・リソース
    3. 10.3 Trademarks
    4. 10.4 Electrostatic Discharge Caution
    5. 10.5 Glossary
  11. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • RHB|32
サーマルパッド・メカニカル・データ
発注情報

9.2.2 Detailed Design Procedure

Referring to Figure 9-1, Schottky diodes (BAS70 or equivalent) protect the ADC inputs from voltage overloads. The ADC inputs are protected from ESD events by the optional ESD protection diodes (TVS0701). The geophone signal is level-shifted to mid-supply by driving the input termination resistors (R1 and R2) common point to 2.5 V. The level-shift voltage is derived from the reference voltage and is buffered by the OPA391 op amp. The input termination resistors also provide the input bias current return path for the ADC inputs.

The input signal is filtered to reduce out-of-band noise. The filter is comprised of common-mode and differential sections. The common-mode section filters noise common to both inputs, consisting of R3, R4, C1, and C2. The differential section filters differential noise, consisting of R3 through R6 and C3. The resistor values are kept low to reduce thermal noise.

The REF6241 4.096-V voltage reference is used. The ADC must be programmed to match the value of the reference voltage. The optional noise filter consisting of R7 and C3 reduces reference noise. Resistor R7 increases gain error resulting from the impedance of the reference input.

The AVDD1 power supply voltage = 5 V, with AVSS connected to AGND. The AVDD2 voltage is 2.5 V to minimize power consumption. If IOVDD = 1.8V, connect the CAPD pin to IOVDD.

Besides the power supply pins, place additional capacitors at certain pins. Capacitors are required between CAPP – CAPN, REFP – REFN, and at the CAPBP, CAPBN, CAPI, CAPR, CAPC, and CAPD pins with the capacitance values given in Figure 9-1. The CAPP – CAPN, CAPBP, and CAPBN capacitors are C0G type.

The DAC1282 provides a low-distortion signal to test THD performance, and through the DAC1282 dc test mode, test geophone impulse response. Increase the value of the DAC1282 capacitors CAPP and CAPN to 10 nF to optimize the ADS1285 THD test performance. See the DAC1282 data sheet for additional circuit details.