SBOA564 December   2022 TRF0206-SP

 

  1.   Single-Event Effects Test Report of the TRF0206-SP 6.5-GHz Differential Amplifier
  2.   Trademarks
  3. 1 Overview
  4. 2 Single-Event Effects
  5. 3 Test Device and Evaluation Board Information
  6. 4 Irradiation Facility and Setup
  7. 5 Depth, Range, and LETEFF Calculation
  8. 6 Test Set-Up and Procedures
  9. 7 Single-Event Latch-up (SEL) Results
  10. 8 Single-Event Transients (SET) Results
  11. 9 Event Rate Calculations
  12. 10Summary
  13.   A Total Ionizing Dose from SEE Experiments
  14.   B Confidence Interval Calculations
  15.   C Orbital Environment Estimations
  16.   D References

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TRF0206-SP 6.5-GHz, Low Noise, Low Power, Fully-Differential Amplifier. Extensive SEE testing with heavy-ions having LETEFF from 9.75 to 82.1 MeV-cm2/mg were conducted with heavy-ion fluences ranging from 106 to 107 ions/cm2 per run. The SEE results demonstrated that the TRF0206-SP is SEL-free up to LETEFF = 82.1 MeV-cm2/mg. Also the SET cross sections are discussed under static input conditions. CREME96-based worst-week event-rate calculations for LEO(ISS) and GEO orbits clearly demonstrate the robustness of the TRF0206-SP in two harshly conservative space environments.