SBOA564 December   2022 TRF0206-SP

 

  1.   Single-Event Effects Test Report of the TRF0206-SP 6.5-GHz Differential Amplifier
  2.   Trademarks
  3. Overview
  4. Single-Event Effects
  5. Test Device and Evaluation Board Information
  6. Irradiation Facility and Setup
  7. Depth, Range, and LETEFF Calculation
  8. Test Set-Up and Procedures
  9. Single-Event Latch-up (SEL) Results
  10. Single-Event Transients (SET) Results
  11. Event Rate Calculations
  12. 10Summary
  13.   A Total Ionizing Dose from SEE Experiments
  14.   B Confidence Interval Calculations
  15.   C Orbital Environment Estimations
  16.   D References

Single-Event Latch-up (SEL) Results

All SEL characterizations were performed with forced hot air to maintain the die temperature at 125°C during the tests. The device was exposed to a Holmium (Ho) heavy-ion beam incident on the die surface at 0° for an effective LET of 82.1 MeV-cm2/mg. A flux of 105 ions/cm2-s and fluence of 107 ions/cm2 per run was used in all runs. The device was powered with voltage of 3.4 V.

Time duration to achieve this fluence was approximately 2 minutes. The SEL results and conditions are provided in Table 7-1. All the runs passed, indicating that the TRF0206-SP is SEL-immune at T = 125°C and LET = 82.1 MeV-cm2/mg.

Table 7-1 Summary of TRF0206-SP SEL Results(1)
Run #

Unit #

Test Type

Temp (°C) Ion Type

LETEFF (MeV-cm2/mg)

Fluence
(ions/cm2)
VDD

(V)

Uniformity

Results

1

1

SEL

125

Ho

82.1

1.0 × 107

3.4

92 %

Pass

2

1

SEL 125 Ho 82.1 1.0 × 107 3.4 92 % Pass
35

2

SEL 125 Ho 82.1 1.0 × 107 3.4 96 % Pass
36

2

SEL 125 Ho 82.1 1.0 × 107 3.4 96 % Pass

37

2

SEL 125

Ho

82.1 1.0 × 107 3.4 96 % Pass

38

3

SEL 125

Ho

82.1 1.0 × 107 3.4 95 % Pass

39

3

SEL 125

Ho

82.1 1.0 × 107 3.4 95 % Pass
SEL results with T = 125°C and LETEFF = 82.1 MeV-cm2/mg