SBOA564 December   2022 TRF0206-SP

 

  1.   Single-Event Effects Test Report of the TRF0206-SP 6.5-GHz Differential Amplifier
  2.   Trademarks
  3. 1 Overview
  4. 2 Single-Event Effects
  5. 3 Test Device and Evaluation Board Information
  6. 4 Irradiation Facility and Setup
  7. 5 Depth, Range, and LETEFF Calculation
  8. 6 Test Set-Up and Procedures
  9. 7 Single-Event Latch-up (SEL) Results
  10. 8 Single-Event Transients (SET) Results
  11. 9 Event Rate Calculations
  12. 10Summary
  13.   A Total Ionizing Dose from SEE Experiments
  14.   B Confidence Interval Calculations
  15.   C Orbital Environment Estimations
  16.   D References

D References

  1. M. Shoga and D. Binder, “Theory of Single Event Latchup in Complementary Metal-Oxide Semiconductor ICs”, IEEE Trans. Nucl. Sci,, 33(6), Dec. 1986, pp. 1714-1717.
  2. G. Bruguier and J.M. Palau, “Single particle-induced latchup”, IEEE Trans. Nucl. Sci, Vol. 43(2), Mar. 1996, pp. 522-532.
  3. TAMU Radiation Effects Facility website. http://cyclotron.tamu.edu/ref/
  4. “The Stopping and Range of Ions in Matter” (SRIM) software simulation tools website. http://www.srim.org/index.htm#SRIMMENU
  5. D. Kececioglu, “Reliability and Life Testing Handbook”, Vol. 1, PTR Prentice Hall, New Jersey,1993, pp. 186-193.
  6. https://creme.isde.vanderbilt.edu/CREME-MC
  7. A. J. Tylka, et al., "CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code", IEEE Trans. Nucl. Sci., 44(6), 1997, pp. 2150-2160.
  8. A. J. Tylka, W. F. Dietrich, and P. R. Bobery, “Probability distributions of high-energy solar-heavy-ion fluxes from IMP-8: 1973-1996”, IEEE Trans. on Nucl. Sci., 44(6), Dec. 1997, pp. 2140 – 2149.
  9. A. J. Tylka, J. H. Adams, P. R. Boberg, et al.,“CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code”, Trans. on Nucl. Sci, 44(6), Dec. 1997, pp. 2150 – 2160.