8 Single-Event Transients (SET) Results

The TRF0206-SP was characterized for SETs from 9.75to 74.92 MeV-cm²/mg (Table 5-1 provides more information) at 3.2 V supply voltage. The device was tested at room temperature for all SETs runs. TRF0206-SP devices were thinned for proper heavy-ion penetration into the active circuits. Average flux of 10⁵ ions/cm²-s and fluences of 10⁷ ions/cm² per run were used during the heavy ion characterization. The devices were tested under static (DC) inputs. The SETs discussed on this report were defined as output voltages excursion that exceed a window trigger set on the DPO7104C. Outputs of the TRF0206-SP were monitored under both conditions each leg of the differential outputs was terminated at 50 Ω in the EVM. Test conditions used during the testing are provided in Table 8-1. Positive and negative upsets excursions were observed under DC test. For each upset the maximum, minimum and transient recovery time was recorded. Weibull-Fit and cross section for the DC tests are shown in Figure 8-1 and Figure 8-2 respectively. The Weibull equation used for the fit is shown in Equation 1, and parameters are provided in Table 8-2. To calculate the cross section values at the different supply voltages the total number of upsets (or transients) and the fluences where combined (add together) by LET_EFF to calculate the upper bound cross section (as discussed in Appendix B) at 95% confidence interval. The σ_PERCASE cross section presented on the summary tables, was calculated using the MTBF method at 95% confidence. When observing the upsets, both outputs legs (inverting and non-inverting) track each other for most of the time. Since both legs track each other differentially the upset is cancelled.