SBOK049 November   2023 OPA4H014-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Test Procedures
  6. 3Facility
  7. 4Results
    1. 4.1 Input Bias Current Parametric Shift
    2. 4.2 Input Offset Voltage Parametric Shift
    3. 4.3 Other Parametric Shifts
  8. 5Summary of Results
  9.   A Test Results

4 Results

There were no functional failures at any irradiation level. Parametric drift to levels outside the data sheet specifications was observed on all devices for the input bias current (and related input offset current) parameter, and on all but one device for the input offset voltage. Some devices experienced parametric drift for open-loop gain. All other tested parameters were observed to be within the test limits of the ATE program for the device, and as a result, within the data sheet specifications.