The failure mode distribution estimation for TIOL112, TIOL1123 and TIOL1125 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
|Die Failure Modes||Failure Mode Distribution (%) |
|Failure Mode Distribution (%) |
|VCC_OUT LDO failure|
VCC_IN internal logic failure
NFAULT logic failure
Wake logic failure
Control logic failure