For the mechanical shock test, the
MIL-STD-883F Method 2002, Condition A profile (500 g acceleration) and Condition B
profile (1500 g acceleration) is used.
For this sinusoidal vibration test,
the following variants are selected.
- LVCMOS Output: DLE-4 (3.2 x 2.5
mm), DLF-4 (2.5 x 2.0 mm)
- Differential Output: DLE-6 (3.2 x
2.5 mm), DLF-6 (2.5 x 2.0 mm)
The following are the steps involved
in setting up the Device Under Test (DUT) board on the vibration fixture and for
conducting the mechanical shock test.
- Parts are soldered down on the
LMK6x evaluation module (EVM) and bolted to the mating plate, which is connected
to the mechanical shock testing machine.
- The Agilent E3631A bench-top
power supply is setup to supply 3.3 V for the EVM module.
- For differential outputs (DLE-6
and DLF-6 package devices), the LVPECL output termination is provided on the
EVM. A TC1-1-13MA+ Balun surface mount RF transformer is used to convert the
differential output to a single-ended output and the output is connected to a
Keysight E5052B phase noise analyzer.
- Shock parameters are set as
below
- For 1500 g, board is
vertically lifted 10.4 inches.
- For 500 g, board is
vertically lifted 3.8 inches.
- Air suction pulls fixture
down to achieve appropriate g-force.
- At least 3 cycles of shock are
performed for each tested sample.
- Transient data is acquired during
shock test.
- Phase noise data is collected as
a screenshot after shock test
The shock
test fixture setup is in Figure 3-19, which shows the mounted LMK6x EVM.