SBASA22B September   2022  – January 2025 ADS131B26-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagram
    9. 5.9 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Offset Drift Measurement
    2. 6.2 Gain Drift Measurement
    3. 6.3 Noise Performance
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Naming Conventions
      2. 7.3.2 Precision Voltage References (REFA, REFB)
      3. 7.3.3 Clocking (MCLK, OSCM, OSCD)
      4. 7.3.4 ADC1y
        1. 7.3.4.1 ADC1y Input Multiplexer
        2. 7.3.4.2 ADC1y Programmable Gain Amplifier (PGA)
        3. 7.3.4.3 ADC1y ΔΣ Modulator
        4. 7.3.4.4 ADC1y Digital Filter
        5. 7.3.4.5 ADC1y Offset and Gain Calibration
        6. 7.3.4.6 ADC1y Conversion Data
      5. 7.3.5 ADC2y
        1. 7.3.5.1 ADC2y Input Multiplexer
        2. 7.3.5.2 ADC2y Programmable Gain Amplifier (PGA)
        3. 7.3.5.3 ADC2y ΔΣ Modulator
        4. 7.3.5.4 ADC2y Digital Filter
        5. 7.3.5.5 ADC2y Offset and Gain Calibration
        6. 7.3.5.6 ADC2y Sequencer
        7. 7.3.5.7 VCMy Buffers
        8. 7.3.5.8 ADC2y Measurement Configurations
        9. 7.3.5.9 ADC2y Conversion Data
      6. 7.3.6 ADC3y
      7. 7.3.7 General-Purpose Digital Inputs and Outputs (GPIO0 to GPIO4)
        1. 7.3.7.1 GPIOx PWM Output Configuration
        2. 7.3.7.2 GPIOx PWM Input Readback
      8. 7.3.8 General-Purpose Digital Inputs and Outputs (GPIO0A, GPIO1A, GPIO0B, GPIO1B)
      9. 7.3.9 Monitors and Diagnostics
        1. 7.3.9.1  Supply Monitors
        2. 7.3.9.2  Clock Monitors
        3. 7.3.9.3  Digital Monitors
          1. 7.3.9.3.1 Register Map CRC
          2. 7.3.9.3.2 Memory Map CRC
          3. 7.3.9.3.3 GPIO Readback
        4. 7.3.9.4  Communication Monitors
        5. 7.3.9.5  Fault Flags and Fault Masking
        6. 7.3.9.6  FAULT Pin
        7. 7.3.9.7  Diagnostics and Diagnostic Procedure
        8. 7.3.9.8  Indicators
        9. 7.3.9.9  Conversion and Sequence Counters
        10. 7.3.9.10 Supply Voltage Readback
        11. 7.3.9.11 Temperature Sensors (TSA, TSB)
        12. 7.3.9.12 Test DACs (TDACA, TDACB)
        13. 7.3.9.13 Open-Wire Detection
        14. 7.3.9.14 Missing Host Detection and MHD Pin
        15. 7.3.9.15 Overcurrent Comparators (OCCA, OCCB)
          1. 7.3.9.15.1 OCCA and OCCB Pins
          2. 7.3.9.15.2 Overcurrent Indication Response Time
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power-Up and Reset
        1. 7.4.1.1 Power-On Reset (POR)
        2. 7.4.1.2 RESETn Pin
        3. 7.4.1.3 RESET Command
      2. 7.4.2 Operating Modes
        1. 7.4.2.1 Active Mode
        2. 7.4.2.2 Standby Mode
        3. 7.4.2.3 Power-Down Mode
      3. 7.4.3 ADC Conversion Modes
        1. 7.4.3.1 ADC1y and ADC3y Conversion Modes
          1. 7.4.3.1.1 Continuous-Conversion Mode
          2. 7.4.3.1.2 Single-Shot Conversion Mode
          3. 7.4.3.1.3 Global-Chop Mode
            1. 7.4.3.1.3.1 Overcurrent Indication Response Time in Global-Chop Mode
        2. 7.4.3.2 ADC2y Sequencer Operation and Sequence Modes
          1. 7.4.3.2.1 Continuous Sequence Mode
          2. 7.4.3.2.2 Single-Shot Sequence Mode
          3. 7.4.3.2.3 Synchronized Single-Shot Sequence Mode Based on ADC1y Conversion Starts
    5. 7.5 Programming
      1. 7.5.1 Serial Interface
        1. 7.5.1.1 Serial Interface Signals
          1. 7.5.1.1.1 Chip Select (CSn)
          2. 7.5.1.1.2 Serial Data Clock (SCLK)
          3. 7.5.1.1.3 Serial Data Input (SDI)
          4. 7.5.1.1.4 Serial Data Output (SDO)
          5. 7.5.1.1.5 Data Ready (DRDYn)
        2. 7.5.1.2 Serial Interface Communication Structure
          1. 7.5.1.2.1 SPI Communication Frames
          2. 7.5.1.2.2 SPI Communication Words
          3. 7.5.1.2.3 STATUS Word
          4. 7.5.1.2.4 Communication Cyclic Redundancy Check (CRC)
          5. 7.5.1.2.5 Commands
            1. 7.5.1.2.5.1 NULL (0000 0000 0000 0000b)
            2. 7.5.1.2.5.2 RESET (0000 0000 0001 0001b)
            3. 7.5.1.2.5.3 LOCK (0000 0101 0101 0101b)
            4. 7.5.1.2.5.4 UNLOCK (0000 0110 0101 0101b)
            5. 7.5.1.2.5.5 WREG (011a aaaa aaa0 0nnnb)
            6. 7.5.1.2.5.6 RREG (101a aaaa aaan nnnnb)
          6. 7.5.1.2.6 SCLK Counter
          7. 7.5.1.2.7 SPI Timeout
          8. 7.5.1.2.8 Reading ADC1A, ADC1B, ADC2A, ADC2B, ADC3A, and ADC3B Conversion Data
          9. 7.5.1.2.9 DRDYn Pin Behavior
  9. 8 Register Map
    1. 8.1 Registers
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Unused Inputs and Outputs
      2. 9.1.2 Minimum Interface Connections
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Current-Shunt Measurement
        2. 9.2.2.2 Battery-Pack Voltage Measurement
        3. 9.2.2.3 Other Voltage Measurements
        4. 9.2.2.4 Shunt Temperature Measurement
        5. 9.2.2.5 Analog Output Temperature Sensor Measurement
      3. 9.2.3 Application Curves
    3. 9.3 Power Supply Recommendations
      1. 9.3.1 Power-Supply Options
        1. 9.3.1.1 Single Unregulated External 4-V to 16-V Supply (3.3-V Digital I/O Levels)
        2. 9.3.1.2 Single Regulated External 3.3-V Supply (3.3-V Digital IO Levels)
        3. 9.3.1.3 Single Regulated External 5-V Supply (5-V Digital I/O Levels)
      2. 9.3.2 Power-Supply Sequencing
      3. 9.3.3 Power-Supply Decoupling
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

5.6 Timing Requirements

over operating ambient temperature range, SDO load: 20 pF || 100 kΩ (unless otherwise noted)
MIN MAX UNIT
3.0 V ≤ IOVDD ≤ 3.6 V
tw(CLH) Pulse duration, CLK high 49 ns
tw(CLL) Pulse duration, CLK low 49 ns
tc(SC) SCLK period 64 ns
tw(SCL) Pulse duration, SCLK low 32 ns
tw(SCH) Pulse duration, SCLK high 32 ns
td(CSSC) Delay time, first SCLK rising edge after CSn falling edge 16 ns
td(SCCS) Delay time, CSn rising edge after final SCLK falling edge 10 ns
tw(CSH) Pulse duration, CSn high 20 ns
tsu(DI) Setup time, SDI valid before SCLK falling egde 5 ns
th(DI) Hold time, SDI valid after SCLK falling edge 8 ns
tw(RSL) Pulse duration, RESETn low to generate device reset 500 ns
4.5 V ≤ IOVDD ≤ 5.5 V
tw(CLL) Pulse duration, CLK low 49 ns
tw(CLH) Pulse duration, CLK high 49 ns
tc(SC) SCLK period 50 ns
tw(SCL) Pulse duration, SCLK low 25 ns
tw(SCH) Pulse duration, SCLK high 25 ns
td(CSSC) Delay time, first SCLK rising edge after CSn falling edge 16 ns
td(SCCS) Delay time, CSn rising edge after final SCLK falling edge 10 ns
tw(CSH) Pulse duration, CSn high 15 ns
tsu(DI) Setup time, SDI valid before SCLK falling egde 5 ns
th(DI) Hold time, SDI valid after SCLK falling edge 8 ns
tw(RSL) Pulse duration, RESETn low to generate device reset 500 ns