SETs are defined as heavy-ion-induced transient upsets on output pins 1Y and 4Z of the SN55LVTA4-SEP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was ¹²⁹Xe for a LET_EFF = 50MeV × cm² / mg. Flux of approximately 10⁵ ions / cm² × s and a fluence of approximately 10⁷ ions / cm² were used for the SET runs.

Three units were tested across multiple input conditions to determine the worst-case setup for SETs. The unit was tested with V_CC of 3V. All combinations of VCC and scope trigger configurations showed no transient upsets, as listed in Table 5-2

To capture SETs, one NI PXI-5110 scope card was used to continuously monitor the output voltage on pin 4Z, and one PXI-5172 scope card was used to continuously monitor the output voltage on pin 1Y. The scope monitoring the square wave output signal was configured to a rising edge window trigger of ±5% and ±20%, while the scope monitoring the static output signal was configured to a rising edge voltage trigger of ±5% and ±20% respectively. The NI scopes were programmed to a sample rate of 100M samples per second (S/s) and recorded 1000 samples, with a 20% pretrigger reference, in case of an event (trigger). The setup was verified for each run to ensure no false triggers was captured before the beam was turned on. The ±5% threshold on the static and square wave outputs was determined to be the lowest threshold capable of not providing false triggers due to noise.

Under heavy-ions, the SN55LVTA4-SEP did not exhibit any transient upsets.