SBOK110 June   2025 SN55LVTA4-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References

6 Summary

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the SN55LVTA4-SEP radiation-tolerant, quad channel differential line driver. SEE performance was verified at minimum (3V) and maximum (3.6V) operating conditions. Heavy-ions with an LETEFF of 50MeV-cm2/ mg were used to irradiate five production devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the SN55LVTA4-SEP is SEL-free up to LETEFF = 50MeV-cm2/ mg as 125°C. SET performance for the minimum and maximum operating voltage saw no excursions ≥ |5%|, as shown and discussed in this report.