SBOK110 June   2025 SN55LVTA4-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References

1 Overview

The SN55LVTA4-SEP is a radiation tolerant quad channel differential line driver that implements the electrical characteristics of low-voltage differential signaling (LVDS) with a 3.3V supply. This driver delivers a minimum differential output voltage magnitude of 247mV into a 100Ω load when enabled.

For more information, see the SN55LVTA4-SEP product page.

Table 1-1 Overview Information
DescriptionDevice Information
TI Part NumberSN55LVTA4-SEP
Orderable Part NumberSN55LVTA4MDTSEP
VID Number

V62/25605

Device FunctionRadiation-tolerant,

Quad channel differential line driver

TechnologyLIN3B
Exposure FacilityFacility for Rare Isotope Beams (FRIB) at Michigan State University – FRIB Single Event Effects (FSEE) Facility
Heavy Ion Fluence per Run1 × 107 ions / cm2
Irradiation Temperature25°C (for SET testing) and 125°C (for SEL testing)