SDAA508 September   2026 DRV81545

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Features
    2. 1.2 Applications
  5. 2Detailed Description
    1. 2.1 DRV81545 Surge (IEC 61000-4-5) with External TVS Diode
      1. 2.1.1 Test Details
      2. 2.1.2 Test Setup
      3. 2.1.3 Results and Observations
      4. 2.1.4 Observations
    2. 2.2 DRV81545 EFT (IEC 61000-4-4) on VM line
      1. 2.2.1 Test Details
      2. 2.2.2 Test Setup
      3. 2.2.3 Results and Observations
      4. 2.2.4 Observations
    3. 2.3 DRV81545 EFT (IEC 61000-4-4) on OUT line
      1. 2.3.1 Test Details
      2. 2.3.2 Test Setup
      3. 2.3.3 Results and Observations
      4. 2.3.4 Observations
    4. 2.4 DRV81545 CISPR-32 Conducted Emissions
      1. 2.4.1 Test Details
      2. 2.4.2 Test Setup
      3. 2.4.3 Results and Observations
      4. 2.4.4 Observations
    5. 2.5 DRV81545 CISPR-32 Radiated Emissions
      1. 2.5.1 Test Details
      2. 2.5.2 Test Setup
      3. 2.5.3 Results and Observations
      4. 2.5.4 Observations
    6. 2.6 Thermal Comparison against Pin-to-Pin and Similar Competition
      1. 2.6.1 Test Details
      2. 2.6.2 Test Setup
      3. 2.6.3 Results and Observations
    7. 2.7 Large Inductive Load Test – 1200mH per OUTx
      1. 2.7.1 Test Details
      2. 2.7.2 Results and Observations
  6. 3Summary
  7. 4References

2.4 DRV81545 CISPR-32 Conducted Emissions

CISPR-32 defines conducted emissions limits for multimedia and information-technology equipment and is widely referenced for industrial product compliance. The conducted emissions measurement quantifies the noise voltage coupled back onto the DC power line through a Line Impedance Stabilization Network (LISN) across 150kHz to 30MHz (extended here to 108MHz). Compliance with these limits indicates that the device does not introduce interference onto a shared power network at levels exceeding the applicable limits.