SDAA508 September   2026 DRV81545

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Features
    2. 1.2 Applications
  5. 2Detailed Description
    1. 2.1 DRV81545 Surge (IEC 61000-4-5) with External TVS Diode
      1. 2.1.1 Test Details
      2. 2.1.2 Test Setup
      3. 2.1.3 Results and Observations
      4. 2.1.4 Observations
    2. 2.2 DRV81545 EFT (IEC 61000-4-4) on VM line
      1. 2.2.1 Test Details
      2. 2.2.2 Test Setup
      3. 2.2.3 Results and Observations
      4. 2.2.4 Observations
    3. 2.3 DRV81545 EFT (IEC 61000-4-4) on OUT line
      1. 2.3.1 Test Details
      2. 2.3.2 Test Setup
      3. 2.3.3 Results and Observations
      4. 2.3.4 Observations
    4. 2.4 DRV81545 CISPR-32 Conducted Emissions
      1. 2.4.1 Test Details
      2. 2.4.2 Test Setup
      3. 2.4.3 Results and Observations
      4. 2.4.4 Observations
    5. 2.5 DRV81545 CISPR-32 Radiated Emissions
      1. 2.5.1 Test Details
      2. 2.5.2 Test Setup
      3. 2.5.3 Results and Observations
      4. 2.5.4 Observations
    6. 2.6 Thermal Comparison against Pin-to-Pin and Similar Competition
      1. 2.6.1 Test Details
      2. 2.6.2 Test Setup
      3. 2.6.3 Results and Observations
    7. 2.7 Large Inductive Load Test – 1200mH per OUTx
      1. 2.7.1 Test Details
      2. 2.7.2 Results and Observations
  6. 3Summary
  7. 4References

2.5 DRV81545 CISPR-32 Radiated Emissions

The radiated emissions portion of CISPR-32 measures the electromagnetic field radiated by the device under test, assessed using calibrated antennas at a defined distance inside a shielded EMC chamber across 30MHz to 1GHz. Compliance with the radiated emissions limits confirms that the device does not produce electromagnetic interference at levels that can affect co-located equipment.