SFFSB18 August   2026 TLIN821-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOIC (D, 8) Package
    2. 2.2 VSON (DRB, 8) Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SOIC (D, 8) Package
    2. 4.2 VSON (DRB, 8) Package
  7. 5Revision History

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for the TLIN821-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
LIN transmitter failure43
LIN receiver failure4
High voltage I/O failure13
Digital logic + I/O buffers failure10
Global power management + state control failure30